A new method for radiation probing of electrical potentials in dielectric films, based on the effect of an electrical field on braking radiation output is described. The sensitivity of the method depends on electron energy, and for 50-100 kev electrons it comprises 100-150 v. This energy range allows testing films with a surface density of 4-12 mg/cm**2.
|Number of pages||2|
|Journal||Instruments and experimental techniques New York|
|Issue number||4 pt 2|
|Publication status||Published - Jul 1984|
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