Mass transfer of elements in the undersurface layers under combined treatment by pulsed ion beams and plasma flows

A. V. Petrov, A. I. Ryabchikov, I. B. Stepanov, V. K. Struts, V. G. Tolmacheva, Yu P. Usov, Ivan Anisimovich Shulepov

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Results are presented for some processes occurring at different stages of strong adhesion of coatings and modified layers creation with the use of high-dose implantation and deep diffusive doping of elements under pulsed energetic impact. The investigations have been carried out to consider the possibility of combined materials treatment with pulsed ion beams of power density ranging from 103 to 108 W/cm2. The facility includes the accelerator of high-power ion beams and the sources of repetitively-pulsed metal ion beams and metal plasma flows.

Original languageEnglish
Title of host publication5th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2001
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages363-366
Number of pages4
Volume1
ISBN (Print)0780370082, 9780780370081
DOIs
Publication statusPublished - 2001
Event5th Korea-Russia International Symposium on Science and Technology, KORUS 2001 - Tomsk, Russian Federation
Duration: 26 Jun 20013 Jul 2001

Other

Other5th Korea-Russia International Symposium on Science and Technology, KORUS 2001
CountryRussian Federation
CityTomsk
Period26.6.013.7.01

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Keywords

  • combined treatment
  • high power ion beam
  • ion mixing
  • mass transfer
  • surface layers

ASJC Scopus subject areas

  • Clinical Biochemistry
  • Computer Networks and Communications
  • Biotechnology
  • Civil and Structural Engineering
  • Mechanics of Materials
  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Surfaces, Coatings and Films

Cite this

Petrov, A. V., Ryabchikov, A. I., Stepanov, I. B., Struts, V. K., Tolmacheva, V. G., Usov, Y. P., & Shulepov, I. A. (2001). Mass transfer of elements in the undersurface layers under combined treatment by pulsed ion beams and plasma flows. In 5th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2001 (Vol. 1, pp. 363-366). [975152] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/KORUS.2001.975152