Manufacture, structure and electrophysical properties of YSZ/SrTixZr1-xO3 solid solution

I. V. Sudzhanskaya, Yu S. Nekrasova, A. S. Gogolev

Research output: Contribution to journalArticlepeer-review

Abstract

Solid solution samples of YSZ/SrTixZr1-xO3 obtained by sol-gel method are characterized by density of 5 g/cm3, porosity of 3.37%, Vickers microhardness of 990 Hv, fracture toughness of 83.8 MPam1/2. X-ray diffraction analysis shows the presence of two phases: a cubic structure (Fm3‾m) phase of yttrium stabilized zirconia dioxide and a tetragonal structure (I4/mcm) phase which corresponds to solid solution of SrTixZr1-xO3 (0.4 < x < 0.95). Frequency dependences of a conductivity and dielectric permittivity of the YSZ/SrTixZr1-xO3 ceramic system are obtained using the method of impedance spectroscopy. It is shown that the conductivity value determined from the high frequency plateau corresponds to the bulk conductivity, in the low frequency plateau – to the grain boundary conductivity. It is found that an activation energy of a conduction process has the values 0.84 eV and 1.43 eV for bulk and for grain boundary, respectively. Dielectric relaxation is observed along the grain boundary in the temperature range of 450 °C–700 °C.

Original languageEnglish
Pages (from-to)28120-28124
Number of pages5
JournalCeramics International
Volume46
Issue number18
DOIs
Publication statusPublished - 15 Dec 2020

Keywords

  • Conductivity
  • Dielectric permittivity
  • Impedance spectroscopy
  • Oxide ceramic
  • Solid solution

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Process Chemistry and Technology
  • Surfaces, Coatings and Films
  • Materials Chemistry

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