Manufacture, structure and electrophysical properties of YSZ/SrTixZr1-xO3 solid solution

Abstract

Solid solution samples of YSZ/SrTi_xZr_1-xO₃ obtained by sol-gel method are characterized by density of 5 g/cm³, porosity of 3.37%, Vickers microhardness of 990 Hv, fracture toughness of 83.8 MPam^1/2. X-ray diffraction analysis shows the presence of two phases: a cubic structure (Fm3‾m) phase of yttrium stabilized zirconia dioxide and a tetragonal structure (I4/mcm) phase which corresponds to solid solution of SrTi_xZr_1-xO₃ (0.4 < x < 0.95). Frequency dependences of a conductivity and dielectric permittivity of the YSZ/SrTi_xZr_1-xO₃ ceramic system are obtained using the method of impedance spectroscopy. It is shown that the conductivity value determined from the high frequency plateau corresponds to the bulk conductivity, in the low frequency plateau – to the grain boundary conductivity. It is found that an activation energy of a conduction process has the values 0.84 eV and 1.43 eV for bulk and for grain boundary, respectively. Dielectric relaxation is observed along the grain boundary in the temperature range of 450 °C–700 °C.

Original language	English
Pages (from-to)	28120-28124
Number of pages	5
Journal	Ceramics International
Volume	46
Issue number	18
DOIs	https://doi.org/10.1016/j.ceramint.2020.07.308
Publication status	Published - 15 Dec 2020

Keywords

Conductivity
Dielectric permittivity
Impedance spectroscopy
Oxide ceramic
Solid solution

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Ceramics and Composites
Process Chemistry and Technology
Surfaces, Coatings and Films
Materials Chemistry

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title = "Manufacture, structure and electrophysical properties of YSZ/SrTixZr1-xO3 solid solution",

abstract = "Solid solution samples of YSZ/SrTixZr1-xO3 obtained by sol-gel method are characterized by density of 5 g/cm3, porosity of 3.37%, Vickers microhardness of 990 Hv, fracture toughness of 83.8 MPam1/2. X-ray diffraction analysis shows the presence of two phases: a cubic structure (Fm3‾m) phase of yttrium stabilized zirconia dioxide and a tetragonal structure (I4/mcm) phase which corresponds to solid solution of SrTixZr1-xO3 (0.4 < x < 0.95). Frequency dependences of a conductivity and dielectric permittivity of the YSZ/SrTixZr1-xO3 ceramic system are obtained using the method of impedance spectroscopy. It is shown that the conductivity value determined from the high frequency plateau corresponds to the bulk conductivity, in the low frequency plateau – to the grain boundary conductivity. It is found that an activation energy of a conduction process has the values 0.84 eV and 1.43 eV for bulk and for grain boundary, respectively. Dielectric relaxation is observed along the grain boundary in the temperature range of 450 °C–700 °C.",

keywords = "Conductivity, Dielectric permittivity, Impedance spectroscopy, Oxide ceramic, Solid solution",

author = "Sudzhanskaya, {I. V.} and Nekrasova, {Yu S.} and Gogolev, {A. S.}",

note = "Funding Information: The work was financially supported by a Program of the Ministry of Education and Science of the Russian Federation for higher education establishments, project No. FZWG-2020-0032 (2019-1569) . This research was partially supported by Tomsk Polytechnic University Competitiveness Enhancement Program. All investigations were carried out by the scientific equipment of joint research centre “Technologies and Materials” at the Belgorod National Research University. Publisher Copyright: {\textcopyright} 2020 Copyright: Copyright 2020 Elsevier B.V., All rights reserved.",

year = "2020",

month = dec,

day = "15",

doi = "10.1016/j.ceramint.2020.07.308",

language = "English",

volume = "46",

pages = "28120--28124",

journal = "Ceramics International",

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T1 - Manufacture, structure and electrophysical properties of YSZ/SrTixZr1-xO3 solid solution

AU - Sudzhanskaya, I. V.

AU - Nekrasova, Yu S.

AU - Gogolev, A. S.

N1 - Funding Information: The work was financially supported by a Program of the Ministry of Education and Science of the Russian Federation for higher education establishments, project No. FZWG-2020-0032 (2019-1569) . This research was partially supported by Tomsk Polytechnic University Competitiveness Enhancement Program. All investigations were carried out by the scientific equipment of joint research centre “Technologies and Materials” at the Belgorod National Research University. Publisher Copyright: © 2020 Copyright: Copyright 2020 Elsevier B.V., All rights reserved.

PY - 2020/12/15

Y1 - 2020/12/15

N2 - Solid solution samples of YSZ/SrTixZr1-xO3 obtained by sol-gel method are characterized by density of 5 g/cm3, porosity of 3.37%, Vickers microhardness of 990 Hv, fracture toughness of 83.8 MPam1/2. X-ray diffraction analysis shows the presence of two phases: a cubic structure (Fm3‾m) phase of yttrium stabilized zirconia dioxide and a tetragonal structure (I4/mcm) phase which corresponds to solid solution of SrTixZr1-xO3 (0.4 < x < 0.95). Frequency dependences of a conductivity and dielectric permittivity of the YSZ/SrTixZr1-xO3 ceramic system are obtained using the method of impedance spectroscopy. It is shown that the conductivity value determined from the high frequency plateau corresponds to the bulk conductivity, in the low frequency plateau – to the grain boundary conductivity. It is found that an activation energy of a conduction process has the values 0.84 eV and 1.43 eV for bulk and for grain boundary, respectively. Dielectric relaxation is observed along the grain boundary in the temperature range of 450 °C–700 °C.

AB - Solid solution samples of YSZ/SrTixZr1-xO3 obtained by sol-gel method are characterized by density of 5 g/cm3, porosity of 3.37%, Vickers microhardness of 990 Hv, fracture toughness of 83.8 MPam1/2. X-ray diffraction analysis shows the presence of two phases: a cubic structure (Fm3‾m) phase of yttrium stabilized zirconia dioxide and a tetragonal structure (I4/mcm) phase which corresponds to solid solution of SrTixZr1-xO3 (0.4 < x < 0.95). Frequency dependences of a conductivity and dielectric permittivity of the YSZ/SrTixZr1-xO3 ceramic system are obtained using the method of impedance spectroscopy. It is shown that the conductivity value determined from the high frequency plateau corresponds to the bulk conductivity, in the low frequency plateau – to the grain boundary conductivity. It is found that an activation energy of a conduction process has the values 0.84 eV and 1.43 eV for bulk and for grain boundary, respectively. Dielectric relaxation is observed along the grain boundary in the temperature range of 450 °C–700 °C.

KW - Conductivity

KW - Dielectric permittivity

KW - Impedance spectroscopy

KW - Oxide ceramic

KW - Solid solution

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Manufacture, structure and electrophysical properties of YSZ/SrTi_xZr_1-xO₃ solid solution

Abstract

Keywords

ASJC Scopus subject areas

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Fingerprint Dive into the research topics of 'Manufacture, structure and electrophysical properties of YSZ/SrTi<sub>x</sub>Zr<sub>1-x</sub>O<sub>3</sub> solid solution'. Together they form a unique fingerprint.

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