Abstract
Temperature dependence of microstructure and phase composition of two sets of nanocrystalline Ti02 thin films magnetron deposited on glass and silicon substrates have been studied by X-ray scattering. X-ray powder diffraction patterns were measured in parallel beam optics and evaluated by the total pattern fitting. After annealing, the amorphous films are crystallized, the nanocrystalline films consisting of anatase and rutile are partially crystallized while pure nanocrystalline anatase films remain nearly unchanged. With increasing temperature above 400 °C significant increase of crystallite size and transformation of anatase into rutile after 700 °C can be observed.
| Original language | English |
|---|---|
| Pages (from-to) | 287-294 |
| Number of pages | 8 |
| Journal | Zeitschrift fur Kristallographie, Supplement |
| Issue number | 27 |
| DOIs | |
| Publication status | Published - 1 Dec 2008 |
Keywords
- Crystallization
- Nanocrystalline thin films
- Powder diffraction
- Titanium dioxide
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Inorganic Chemistry
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Kužel, R., Nichtová, L., Matěj, Z., Šícha, J., & Musil, J. (2008). Magnetron deposited TiO2 thin films-crystallization and temperature dependence of microstructure and phase composition. Zeitschrift fur Kristallographie, Supplement, (27), 287-294. https://doi.org/10.1524/zksu.2008.0035