Localized high field enhancements from hemispherical 3D mesoscale dielectric particles in the refection mode

Igor V. Minin, Oleg V. Minin, Nikita A. Kharitoshin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

In this paper the formation of photonic jet is demonstrated using 3D dielectric hemispheres working in 'refection' mode when the specific spatially localized region is localized towards the direction of incidence wavefront. The results of simulation based on Finite Integration Technique are discussed. All dimensions are given in wavelength units so that all results can be scaled to any frequency of interest including optical frequencies, simplifying the fabrication process compared with spherical dielectrics. The results here presented may be of interest for novel applications including microscopy techniques and sensors.

Original languageEnglish
Title of host publication2015 16th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2015 - Proceedings
PublisherIEEE Computer Society
Pages331-333
Number of pages3
Volume2015-August
ISBN (Electronic)9781467367196
DOIs
Publication statusPublished - 10 Aug 2015
Externally publishedYes
Event16th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2015 - Erlagol, Altai, Russian Federation
Duration: 29 Jun 20153 Jul 2015

Conference

Conference16th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2015
CountryRussian Federation
CityErlagol, Altai
Period29.6.153.7.15

Keywords

  • mirror
  • numerical simulation
  • photonic nanojet
  • terajet
  • the dielectric structure
  • the wave front

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Minin, I. V., Minin, O. V., & Kharitoshin, N. A. (2015). Localized high field enhancements from hemispherical 3D mesoscale dielectric particles in the refection mode. In 2015 16th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2015 - Proceedings (Vol. 2015-August, pp. 331-333). [7184556] IEEE Computer Society. https://doi.org/10.1109/EDM.2015.7184556