Abstract
The first results of studying the properties of X- and G-ray beams generated at the grazing incidence of 18-MeV electrons with the 50 and 8-μm-thick Si crystals and a 13-μm-thick Ta foil of 4 mm in length along the electron beam are presented. The target has been placed in a goniometer inside the chamber of a B-18 betatron. The results exhibit strong changes in the angular distribution of radiation at the variation of the orientation of the target. This effect is not observed in the case of the normal incidence of electrons on the surface of a thin target. Images of a reference microstructure have been obtained with a high resolution of details of the microstructure owing to the smallness of the source of radiation. The dependence of the contrast of an image on the position of the microstructure in the radiation cone has been demonstrated, which is determined by the change in the effective size of the radiation source when the emission angle of the source is changed.
| Original language | English |
|---|---|
| Article number | 012007 |
| Journal | Journal of Physics: Conference Series |
| Volume | 881 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 30 Aug 2017 |
| Event | International Conference on Innovations in Non-Destructive Testing, SibTest 2017 - Sosnovkav, Novosibirsk, Russian Federation Duration: 27 Jun 2017 → 30 Jun 2017 |
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ASJC Scopus subject areas
- Physics and Astronomy(all)
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Linear microfocus bremsstrahlung generated in light and heavy narrow targets in B-18 betatron. / Rychkov, M. M.; Kaplin, V. V.; Malikov, E. L.; Smolyanskiy, V. A.; Stepanov, I. B.; Lutsenko, A. S.; Gentsel'Man, V.; Vas'Kovskii, I. K.
In: Journal of Physics: Conference Series, Vol. 881, No. 1, 012007, 30.08.2017.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Linear microfocus bremsstrahlung generated in light and heavy narrow targets in B-18 betatron
AU - Rychkov, M. M.
AU - Kaplin, V. V.
AU - Malikov, E. L.
AU - Smolyanskiy, V. A.
AU - Stepanov, I. B.
AU - Lutsenko, A. S.
AU - Gentsel'Man, V.
AU - Vas'Kovskii, I. K.
PY - 2017/8/30
Y1 - 2017/8/30
N2 - The first results of studying the properties of X- and G-ray beams generated at the grazing incidence of 18-MeV electrons with the 50 and 8-μm-thick Si crystals and a 13-μm-thick Ta foil of 4 mm in length along the electron beam are presented. The target has been placed in a goniometer inside the chamber of a B-18 betatron. The results exhibit strong changes in the angular distribution of radiation at the variation of the orientation of the target. This effect is not observed in the case of the normal incidence of electrons on the surface of a thin target. Images of a reference microstructure have been obtained with a high resolution of details of the microstructure owing to the smallness of the source of radiation. The dependence of the contrast of an image on the position of the microstructure in the radiation cone has been demonstrated, which is determined by the change in the effective size of the radiation source when the emission angle of the source is changed.
AB - The first results of studying the properties of X- and G-ray beams generated at the grazing incidence of 18-MeV electrons with the 50 and 8-μm-thick Si crystals and a 13-μm-thick Ta foil of 4 mm in length along the electron beam are presented. The target has been placed in a goniometer inside the chamber of a B-18 betatron. The results exhibit strong changes in the angular distribution of radiation at the variation of the orientation of the target. This effect is not observed in the case of the normal incidence of electrons on the surface of a thin target. Images of a reference microstructure have been obtained with a high resolution of details of the microstructure owing to the smallness of the source of radiation. The dependence of the contrast of an image on the position of the microstructure in the radiation cone has been demonstrated, which is determined by the change in the effective size of the radiation source when the emission angle of the source is changed.
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UR - http://www.scopus.com/inward/citedby.url?scp=85029506346&partnerID=8YFLogxK
U2 - 10.1088/1742-6596/881/1/012007
DO - 10.1088/1742-6596/881/1/012007
M3 - Article
AN - SCOPUS:85029506346
VL - 881
JO - Journal of Physics: Conference Series
JF - Journal of Physics: Conference Series
SN - 1742-6588
IS - 1
M1 - 012007
ER -