Laser monitor for non-destructive testing of materials and processes shielded by intensive background lighting

G. S. Evtushenko, M. V. Trigub, F. A. Gubarev, T. G. Evtushenko, S. N. Torgaev, D. V. Shiyanov

Research output: Contribution to journalArticle

52 Citations (Scopus)

Abstract

A single-pulse imaging laser projection system (laser monitor) is proposed for real-time monitoring high-speed processes shielded by the intensive background lighting. The brightness temperature of the lighting can reach thousands or even tens of thousands of degrees, which makes it difficult to observe the processes with the naked eye. The estimates of limiting temperatures show that the use of the proposed instrument allows to view the objects when the equivalent brightness temperature of the background lighting is up to 45 000 K. The results of visualization of some bright objects and processes using high-speed copper bromide vapor laser monitor are presented.

Original languageEnglish
Article number033111
JournalReview of Scientific Instruments
Volume85
Issue number3
DOIs
Publication statusPublished - 2014

Fingerprint

Nondestructive examination
illuminating
monitors
Lighting
brightness temperature
Lasers
Luminance
high speed
lasers
Projection systems
Temperature
bromides
Laser pulses
Visualization
projection
Vapors
vapors
Copper
Imaging techniques
copper

ASJC Scopus subject areas

  • Instrumentation

Cite this

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title = "Laser monitor for non-destructive testing of materials and processes shielded by intensive background lighting",
abstract = "A single-pulse imaging laser projection system (laser monitor) is proposed for real-time monitoring high-speed processes shielded by the intensive background lighting. The brightness temperature of the lighting can reach thousands or even tens of thousands of degrees, which makes it difficult to observe the processes with the naked eye. The estimates of limiting temperatures show that the use of the proposed instrument allows to view the objects when the equivalent brightness temperature of the background lighting is up to 45 000 K. The results of visualization of some bright objects and processes using high-speed copper bromide vapor laser monitor are presented.",
author = "Evtushenko, {G. S.} and Trigub, {M. V.} and Gubarev, {F. A.} and Evtushenko, {T. G.} and Torgaev, {S. N.} and Shiyanov, {D. V.}",
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T1 - Laser monitor for non-destructive testing of materials and processes shielded by intensive background lighting

AU - Evtushenko, G. S.

AU - Trigub, M. V.

AU - Gubarev, F. A.

AU - Evtushenko, T. G.

AU - Torgaev, S. N.

AU - Shiyanov, D. V.

PY - 2014

Y1 - 2014

N2 - A single-pulse imaging laser projection system (laser monitor) is proposed for real-time monitoring high-speed processes shielded by the intensive background lighting. The brightness temperature of the lighting can reach thousands or even tens of thousands of degrees, which makes it difficult to observe the processes with the naked eye. The estimates of limiting temperatures show that the use of the proposed instrument allows to view the objects when the equivalent brightness temperature of the background lighting is up to 45 000 K. The results of visualization of some bright objects and processes using high-speed copper bromide vapor laser monitor are presented.

AB - A single-pulse imaging laser projection system (laser monitor) is proposed for real-time monitoring high-speed processes shielded by the intensive background lighting. The brightness temperature of the lighting can reach thousands or even tens of thousands of degrees, which makes it difficult to observe the processes with the naked eye. The estimates of limiting temperatures show that the use of the proposed instrument allows to view the objects when the equivalent brightness temperature of the background lighting is up to 45 000 K. The results of visualization of some bright objects and processes using high-speed copper bromide vapor laser monitor are presented.

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