Laser monitor for imaging of the processes located at different distances

Maxim V. Trigub, Kirill V. Fedorov, Vasiliy V. Vlasov, Gennadiy S. Evtushenko

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Actual methods of the long lasing pulse obtaining in CuBr active medium was observed. A compact pump source, which can be used in mode with low energy input in the discherge was developed. The source is stable working in low frequencies (2-3 kHz) and allows to achieve a pulse duration up to 100 ns. Moreover, this source allows to operate with the pulse repetition frequency of up to 50 kHz. Developed device was used to study the influence of the distance between the observed object and the brightness amplifier on the image quality and on the process of signal amplification in active medium. In case of working in the mode with atypical duration of laser pulse it is became possible to image the objects at a distance up to 9 meters with no loss in images quality.

Original languageEnglish
Title of host publication2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2016 - Proceedings
PublisherIEEE Computer Society
Pages295-299
Number of pages5
Volume2016-August
ISBN (Electronic)9781509007868
DOIs
Publication statusPublished - 9 Aug 2016
Event17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2016 - Erlagol, Altai, Russian Federation
Duration: 30 Jun 20164 Jul 2016

Conference

Conference17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2016
CountryRussian Federation
CityErlagol, Altai
Period30.6.164.7.16

Fingerprint

Image quality
monitors
Imaging techniques
Lasers
Laser modes
pulses
lasers
Amplification
Luminance
Laser pulses
Pumps
lasing
repetition
brightness
pulse duration
amplifiers
pumps
low frequencies
energy

Keywords

  • Active optical system
  • diagnostics
  • excitation circuit
  • imaging
  • laser monitor

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

Cite this

Trigub, M. V., Fedorov, K. V., Vlasov, V. V., & Evtushenko, G. S. (2016). Laser monitor for imaging of the processes located at different distances. In 2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2016 - Proceedings (Vol. 2016-August, pp. 295-299). [7538744] IEEE Computer Society. https://doi.org/10.1109/EDM.2016.7538744

Laser monitor for imaging of the processes located at different distances. / Trigub, Maxim V.; Fedorov, Kirill V.; Vlasov, Vasiliy V.; Evtushenko, Gennadiy S.

2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2016 - Proceedings. Vol. 2016-August IEEE Computer Society, 2016. p. 295-299 7538744.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Trigub, MV, Fedorov, KV, Vlasov, VV & Evtushenko, GS 2016, Laser monitor for imaging of the processes located at different distances. in 2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2016 - Proceedings. vol. 2016-August, 7538744, IEEE Computer Society, pp. 295-299, 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2016, Erlagol, Altai, Russian Federation, 30.6.16. https://doi.org/10.1109/EDM.2016.7538744
Trigub MV, Fedorov KV, Vlasov VV, Evtushenko GS. Laser monitor for imaging of the processes located at different distances. In 2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2016 - Proceedings. Vol. 2016-August. IEEE Computer Society. 2016. p. 295-299. 7538744 https://doi.org/10.1109/EDM.2016.7538744
Trigub, Maxim V. ; Fedorov, Kirill V. ; Vlasov, Vasiliy V. ; Evtushenko, Gennadiy S. / Laser monitor for imaging of the processes located at different distances. 2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2016 - Proceedings. Vol. 2016-August IEEE Computer Society, 2016. pp. 295-299
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