Laboratory model for low current excitation of metal vapor active media lasers

Pavel I. Gembukh, Valeriy F. Fedorov, Dmitriy V. Shiyanov, Maxim V. Trigub

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The paper presents the results of development laboratory model for evaluation of efficiency of metal vapor active media excitation. Low current excitation mode is investigated. Low current mode is found to differ from the typical mode of excitation by amplitude of pump current, which is units of amperes in this mode. The radiation in low current mode was detected. Efficiency was grown in 2.5 times in difference with the typical mode of excitation.

Original languageEnglish
Title of host publication2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2020
PublisherIEEE Computer Society
Pages272-275
Number of pages4
ISBN (Electronic)9781728168463
DOIs
Publication statusPublished - Jun 2020
Externally publishedYes
Event21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2020 - Chemal, Russian Federation
Duration: 29 Jun 20203 Jul 2020

Publication series

NameInternational Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM
Volume2020-June
ISSN (Print)2325-4173
ISSN (Electronic)2325-419X

Conference

Conference21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2020
CountryRussian Federation
CityChemal
Period29.6.203.7.20

Keywords

  • Copper vapor lasers
  • Efficiency
  • Low current mode
  • Reduced energy input

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Gembukh, P. I., Fedorov, V. F., Shiyanov, D. V., & Trigub, M. V. (2020). Laboratory model for low current excitation of metal vapor active media lasers. In 2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2020 (pp. 272-275). [9153344] (International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM; Vol. 2020-June). IEEE Computer Society. https://doi.org/10.1109/EDM49804.2020.9153344