Investigations of radiation generation under the grazing interaction between a betatron’s internal beam and periodic layered structures

M. M. Rychkov, V. V. Kaplin, S. I. Kuznetsov, K. V. Suharnikov, I. K. Vaskovsky

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

The first results of an experimental investigation into the generation of X-ray bremsstrahlung under grazing interaction between the internal 18-MeV electron beam of a B-18 betatron and a silicon crystal 50 μm thick and 4 mm long along the electron beam are presented. The experiments refer to the research of X-ray formation in the case of the grazing interaction of electrons with layered structures created on thin Si substrate surfaces. In the case of emission from layered structures, radiation emitted from the substrates is an intense background varying greatly with substrate orientation. This must be taken into account when the orientation dependences of the characteristics, e.g., radiation formed in X-ray mirrors and waveguides, are measured.

Original languageEnglish
Pages (from-to)660-663
Number of pages4
JournalJournal of Surface Investigation
Volume11
Issue number3
DOIs
Publication statusPublished - 1 May 2017

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Betatrons
Radiation
X rays
Electron beams
Substrates
Beam plasma interactions
Silicon
Waveguides
Crystals
Electrons
Experiments

Keywords

  • angular distributions
  • betatron
  • orientation dependences
  • relativistic electrons
  • surface layered structures
  • X-ray radiation

ASJC Scopus subject areas

  • Surfaces, Coatings and Films

Cite this

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AU - Rychkov, M. M.

AU - Kaplin, V. V.

AU - Kuznetsov, S. I.

AU - Suharnikov, K. V.

AU - Vaskovsky, I. K.

PY - 2017/5/1

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AB - The first results of an experimental investigation into the generation of X-ray bremsstrahlung under grazing interaction between the internal 18-MeV electron beam of a B-18 betatron and a silicon crystal 50 μm thick and 4 mm long along the electron beam are presented. The experiments refer to the research of X-ray formation in the case of the grazing interaction of electrons with layered structures created on thin Si substrate surfaces. In the case of emission from layered structures, radiation emitted from the substrates is an intense background varying greatly with substrate orientation. This must be taken into account when the orientation dependences of the characteristics, e.g., radiation formed in X-ray mirrors and waveguides, are measured.

KW - angular distributions

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KW - orientation dependences

KW - relativistic electrons

KW - surface layered structures

KW - X-ray radiation

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