INVESTIGATION OF THIN GeO FILMS BY THE POSITRON ANNIHILATION METHOD.

K. P. Aref'ev, S. A. Vorob'ev, V. G. Starodubov

Research output: Chapter in Book/Report/Conference proceedingChapter

2 Citations (Scopus)

Abstract

Study of the properties of thin GeO films as a function of the substrate temperature and the rate of evaporation of the condensate using the positron spectroscopy method is described.

Original languageEnglish
Title of host publicationSov Phys Semicond
Pages794-795
Number of pages2
Volume8
Edition6
Publication statusPublished - Dec 1974

Fingerprint

Positron annihilation
Positrons
Evaporation
Spectroscopy
Thin films
Substrates
Temperature

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Aref'ev, K. P., Vorob'ev, S. A., & Starodubov, V. G. (1974). INVESTIGATION OF THIN GeO FILMS BY THE POSITRON ANNIHILATION METHOD. In Sov Phys Semicond (6 ed., Vol. 8, pp. 794-795)

INVESTIGATION OF THIN GeO FILMS BY THE POSITRON ANNIHILATION METHOD. / Aref'ev, K. P.; Vorob'ev, S. A.; Starodubov, V. G.

Sov Phys Semicond. Vol. 8 6. ed. 1974. p. 794-795.

Research output: Chapter in Book/Report/Conference proceedingChapter

Aref'ev, KP, Vorob'ev, SA & Starodubov, VG 1974, INVESTIGATION OF THIN GeO FILMS BY THE POSITRON ANNIHILATION METHOD. in Sov Phys Semicond. 6 edn, vol. 8, pp. 794-795.
Aref'ev KP, Vorob'ev SA, Starodubov VG. INVESTIGATION OF THIN GeO FILMS BY THE POSITRON ANNIHILATION METHOD. In Sov Phys Semicond. 6 ed. Vol. 8. 1974. p. 794-795
Aref'ev, K. P. ; Vorob'ev, S. A. ; Starodubov, V. G. / INVESTIGATION OF THIN GeO FILMS BY THE POSITRON ANNIHILATION METHOD. Sov Phys Semicond. Vol. 8 6. ed. 1974. pp. 794-795
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