INVESTIGATION OF THIN GeO FILMS BY THE POSITRON ANNIHILATION METHOD.

K. P. Aref'ev, S. A. Vorob'ev, V. G. Starodubov

Research output: Chapter in Book/Report/Conference proceedingChapter

2 Citations (Scopus)

Abstract

Study of the properties of thin GeO films as a function of the substrate temperature and the rate of evaporation of the condensate using the positron spectroscopy method is described.

Original languageEnglish
Title of host publicationSov Phys Semicond
Pages794-795
Number of pages2
Volume8
Edition6
Publication statusPublished - Dec 1974

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ASJC Scopus subject areas

  • Engineering(all)

Cite this

Aref'ev, K. P., Vorob'ev, S. A., & Starodubov, V. G. (1974). INVESTIGATION OF THIN GeO FILMS BY THE POSITRON ANNIHILATION METHOD. In Sov Phys Semicond (6 ed., Vol. 8, pp. 794-795)