Investigation of the morphology and elemental composition of the silicon-containing calcium phosphate coating treated by intensive pulsed electron beam

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The surface of titanium substrate with calcium phosphate (CaP) coating prepared by RF magnetron sputtering was treated by a pulsed electron beam with an energy density of 0.8-8 J/cm2. A partial or complete intermixing of the surface layers of the system CaP-titanium was observed. Significant changes in the topography of the formed surfaces were revealed. Treatment conditions with an energy density of 0.8 and 3 J/cm2 led to the thermal annealing of the coating. The use of beam parameters with an energy density of 6.5 and 8 J/cm2 led to the partial vaporization and intermixing of the coating with a titanium matrix.

Original languageEnglish
Title of host publication2014 9th International Forum on Strategic Technology, IFOST 2014
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages429-431
Number of pages3
ISBN (Print)9781479960620
DOIs
Publication statusPublished - 17 Dec 2014
Event9th International Forum on Strategic Technology, IFOST 2014 - Cox's Bazar, Bangladesh
Duration: 21 Oct 201423 Oct 2014

Other

Other9th International Forum on Strategic Technology, IFOST 2014
CountryBangladesh
CityCox's Bazar
Period21.10.1423.10.14

Keywords

  • calcium phosphate
  • electron beam treatment
  • rf-magnetron sputtering

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Civil and Structural Engineering
  • Building and Construction
  • Fuel Technology
  • Computer Networks and Communications

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  • Cite this

    Chudinova, E. A., Surmeneva, M. A., Grubova, I. Y., Priamushko, T. S., Pushilina, N. S., Teresov, A. D., Koval, N. N., Prymak, O., Epple, M., & Surmenev, R. A. (2014). Investigation of the morphology and elemental composition of the silicon-containing calcium phosphate coating treated by intensive pulsed electron beam. In 2014 9th International Forum on Strategic Technology, IFOST 2014 (pp. 429-431). [6991155] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IFOST.2014.6991155