Investigation of the Effect of Blocking Potential on the Static Breakdown Voltage and Discharge Initiation in Pseudospark Switches

V. D. Bochkov, A. V. Kolesnikov, Y. D. Korolev, V. G. Rabotkin, O. B. Frantz, I. A. Shemyakin

    Research output: Contribution to journalArticle

    21 Citations (Scopus)

    Abstract

    The measurement data on the currents in the pre-breakdown phase and the static breakdown voltage for the pseudospark switch with a blocking electrode and a trigger unit based on an auxiliary glow discharge are presented. The use of the blocking electrode offers the possibility to extend the range of operating pressures for the switch with conservation of a high level of static breakdown voltage and low level of delay time. It is shown that the effect of the blocking electrode on the static breakdown voltage is due to suppression of the hollow cathode effect in the main gap of the switch.

    Original languageEnglish
    Pages (from-to)341-346
    Number of pages6
    JournalIEEE Transactions on Plasma Science
    Volume23
    Issue number3
    DOIs
    Publication statusPublished - 1 Jan 1995

    Fingerprint

    electrical faults
    switches
    electrodes
    hollow cathodes
    glow discharges
    conservation
    time lag
    breakdown
    actuators
    retarding

    ASJC Scopus subject areas

    • Nuclear and High Energy Physics
    • Condensed Matter Physics

    Cite this

    Investigation of the Effect of Blocking Potential on the Static Breakdown Voltage and Discharge Initiation in Pseudospark Switches. / Bochkov, V. D.; Kolesnikov, A. V.; Korolev, Y. D.; Rabotkin, V. G.; Frantz, O. B.; Shemyakin, I. A.

    In: IEEE Transactions on Plasma Science, Vol. 23, No. 3, 01.01.1995, p. 341-346.

    Research output: Contribution to journalArticle

    Bochkov, V. D. ; Kolesnikov, A. V. ; Korolev, Y. D. ; Rabotkin, V. G. ; Frantz, O. B. ; Shemyakin, I. A. / Investigation of the Effect of Blocking Potential on the Static Breakdown Voltage and Discharge Initiation in Pseudospark Switches. In: IEEE Transactions on Plasma Science. 1995 ; Vol. 23, No. 3. pp. 341-346.
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