Investigation of the characteristics of CMOS ICs at low temperatures

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Certain types of complementary metal-oxide-semiconductor (CMOS) and high-speed complementary metal-oxide-semiconductor (HCMOS) integrated circuits (ICs) were investigated at temperatures T from 1.4 to 297 K. Basic parameters of integrated multiplexers operating at liquid helium temperature were measured. Integrated circuits of the K1564 and 74HC family fabricated by HCMOS technology exhibited the best characteristics at T = 4.2 K.

Original languageEnglish
Pages (from-to)581-584
Number of pages4
JournalInstruments and Experimental Techniques
Volume40
Issue number4
Publication statusPublished - Jul 1997
Externally publishedYes

ASJC Scopus subject areas

  • Engineering (miscellaneous)
  • Instrumentation

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