Investigation of the applicability of parametric x-ray radiation for transverse beam profile diagnostics

G. Kube, C. Behrens, A. S. Gogolev, Yu P. Popov, A. P. Potylitsyn, W. Lauth, S. Weisse

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Citations (Scopus)

Abstract

Optical transition radiation (OTR) which is observed in backward direction when a charged particle beam crosses the boundary between two media with different dielectric properties is widely used as standard technique for transverse beam profile diagnostics in electron linacs. The experience from modern linac based light sources like LCLS or FLASH shows that OTR diagnostics might fail because of coherence effects in the OTR emission process. A possibility to overcome this limitation is to measure at much shorter wavelengths, i.e. in the X-ray region, using parametric X-ray radiation (PXR) which additionally offers the advantage to be generated at crystal planes oriented under a certain angle to the crystal surface, thus allowing a spatial separation from a possible coherent OTR background. A first test experiment has been performed at the Mainz Microtron MAMI in order to study the applicability of PXR for beam diagnostics, and status and results of this experiment are reported.

Original languageEnglish
Title of host publicationIPAC 2013
Subtitle of host publicationProceedings of the 4th International Particle Accelerator Conference
Pages491-493
Number of pages3
Publication statusPublished - 24 Dec 2013
Event4th International Particle Accelerator Conference, IPAC 2013 - Shanghai, China
Duration: 12 May 201317 May 2013

Other

Other4th International Particle Accelerator Conference, IPAC 2013
CountryChina
CityShanghai
Period12.5.1317.5.13

Fingerprint

optical transition
radiation
profiles
x rays
background radiation
particle beams
crystal surfaces
dielectric properties
light sources
charged particles
wavelengths
crystals
electrons

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Kube, G., Behrens, C., Gogolev, A. S., Popov, Y. P., Potylitsyn, A. P., Lauth, W., & Weisse, S. (2013). Investigation of the applicability of parametric x-ray radiation for transverse beam profile diagnostics. In IPAC 2013: Proceedings of the 4th International Particle Accelerator Conference (pp. 491-493)

Investigation of the applicability of parametric x-ray radiation for transverse beam profile diagnostics. / Kube, G.; Behrens, C.; Gogolev, A. S.; Popov, Yu P.; Potylitsyn, A. P.; Lauth, W.; Weisse, S.

IPAC 2013: Proceedings of the 4th International Particle Accelerator Conference. 2013. p. 491-493.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kube, G, Behrens, C, Gogolev, AS, Popov, YP, Potylitsyn, AP, Lauth, W & Weisse, S 2013, Investigation of the applicability of parametric x-ray radiation for transverse beam profile diagnostics. in IPAC 2013: Proceedings of the 4th International Particle Accelerator Conference. pp. 491-493, 4th International Particle Accelerator Conference, IPAC 2013, Shanghai, China, 12.5.13.
Kube G, Behrens C, Gogolev AS, Popov YP, Potylitsyn AP, Lauth W et al. Investigation of the applicability of parametric x-ray radiation for transverse beam profile diagnostics. In IPAC 2013: Proceedings of the 4th International Particle Accelerator Conference. 2013. p. 491-493
Kube, G. ; Behrens, C. ; Gogolev, A. S. ; Popov, Yu P. ; Potylitsyn, A. P. ; Lauth, W. ; Weisse, S. / Investigation of the applicability of parametric x-ray radiation for transverse beam profile diagnostics. IPAC 2013: Proceedings of the 4th International Particle Accelerator Conference. 2013. pp. 491-493
@inproceedings{957f74774a204d88ba6717a81a77d322,
title = "Investigation of the applicability of parametric x-ray radiation for transverse beam profile diagnostics",
abstract = "Optical transition radiation (OTR) which is observed in backward direction when a charged particle beam crosses the boundary between two media with different dielectric properties is widely used as standard technique for transverse beam profile diagnostics in electron linacs. The experience from modern linac based light sources like LCLS or FLASH shows that OTR diagnostics might fail because of coherence effects in the OTR emission process. A possibility to overcome this limitation is to measure at much shorter wavelengths, i.e. in the X-ray region, using parametric X-ray radiation (PXR) which additionally offers the advantage to be generated at crystal planes oriented under a certain angle to the crystal surface, thus allowing a spatial separation from a possible coherent OTR background. A first test experiment has been performed at the Mainz Microtron MAMI in order to study the applicability of PXR for beam diagnostics, and status and results of this experiment are reported.",
author = "G. Kube and C. Behrens and Gogolev, {A. S.} and Popov, {Yu P.} and Potylitsyn, {A. P.} and W. Lauth and S. Weisse",
year = "2013",
month = "12",
day = "24",
language = "English",
isbn = "9783954501229",
pages = "491--493",
booktitle = "IPAC 2013",

}

TY - GEN

T1 - Investigation of the applicability of parametric x-ray radiation for transverse beam profile diagnostics

AU - Kube, G.

AU - Behrens, C.

AU - Gogolev, A. S.

AU - Popov, Yu P.

AU - Potylitsyn, A. P.

AU - Lauth, W.

AU - Weisse, S.

PY - 2013/12/24

Y1 - 2013/12/24

N2 - Optical transition radiation (OTR) which is observed in backward direction when a charged particle beam crosses the boundary between two media with different dielectric properties is widely used as standard technique for transverse beam profile diagnostics in electron linacs. The experience from modern linac based light sources like LCLS or FLASH shows that OTR diagnostics might fail because of coherence effects in the OTR emission process. A possibility to overcome this limitation is to measure at much shorter wavelengths, i.e. in the X-ray region, using parametric X-ray radiation (PXR) which additionally offers the advantage to be generated at crystal planes oriented under a certain angle to the crystal surface, thus allowing a spatial separation from a possible coherent OTR background. A first test experiment has been performed at the Mainz Microtron MAMI in order to study the applicability of PXR for beam diagnostics, and status and results of this experiment are reported.

AB - Optical transition radiation (OTR) which is observed in backward direction when a charged particle beam crosses the boundary between two media with different dielectric properties is widely used as standard technique for transverse beam profile diagnostics in electron linacs. The experience from modern linac based light sources like LCLS or FLASH shows that OTR diagnostics might fail because of coherence effects in the OTR emission process. A possibility to overcome this limitation is to measure at much shorter wavelengths, i.e. in the X-ray region, using parametric X-ray radiation (PXR) which additionally offers the advantage to be generated at crystal planes oriented under a certain angle to the crystal surface, thus allowing a spatial separation from a possible coherent OTR background. A first test experiment has been performed at the Mainz Microtron MAMI in order to study the applicability of PXR for beam diagnostics, and status and results of this experiment are reported.

UR - http://www.scopus.com/inward/record.url?scp=84890647079&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84890647079&partnerID=8YFLogxK

M3 - Conference contribution

SN - 9783954501229

SP - 491

EP - 493

BT - IPAC 2013

ER -