Abstract
Studies were performed of the influence of interface profile as well as hardened layer thickness on the pattern of crack distribution in coating under static tension of "structural steel-hardening coating" compositions. The method of diffusion borating was used for surface hardening. Borated layers have discrete structure and consist of sequentially located phases having different strength. The interfaces had toothed, needled of plane profiles that depended on chemical content and structure of substrate as well as on surface impregnation modes. Different interface profiles were obtained on structural (3% Ni, - 1% Mo) and low-carbon steel specimens.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of the 7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2001 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 79-81 |
| Number of pages | 3 |
| ISBN (Print) | 0780363469, 9780780363465 |
| DOIs | |
| Publication status | Published - 2001 |
| Event | 7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists on Modern Techniques and Technology, MTT 2001 - Tomsk, Russian Federation Duration: 26 Feb 2001 → 2 Mar 2001 |
Other
| Other | 7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists on Modern Techniques and Technology, MTT 2001 |
|---|---|
| Country | Russian Federation |
| City | Tomsk |
| Period | 26.2.01 → 2.3.01 |
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ASJC Scopus subject areas
- Biotechnology
- Computer Science Applications
- Civil and Structural Engineering
- Mechanical Engineering
- Materials Science (miscellaneous)
- Instrumentation
- Education
Cite this
Investigation of cracking pattern of brittle hardening layers under tension of coated specimens. / Koval, A. V.; Panin, S. V.
Proceedings of the 7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2001. Institute of Electrical and Electronics Engineers Inc., 2001. p. 79-81 983742.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Investigation of cracking pattern of brittle hardening layers under tension of coated specimens
AU - Koval, A. V.
AU - Panin, S. V.
PY - 2001
Y1 - 2001
N2 - Studies were performed of the influence of interface profile as well as hardened layer thickness on the pattern of crack distribution in coating under static tension of "structural steel-hardening coating" compositions. The method of diffusion borating was used for surface hardening. Borated layers have discrete structure and consist of sequentially located phases having different strength. The interfaces had toothed, needled of plane profiles that depended on chemical content and structure of substrate as well as on surface impregnation modes. Different interface profiles were obtained on structural (3% Ni, - 1% Mo) and low-carbon steel specimens.
AB - Studies were performed of the influence of interface profile as well as hardened layer thickness on the pattern of crack distribution in coating under static tension of "structural steel-hardening coating" compositions. The method of diffusion borating was used for surface hardening. Borated layers have discrete structure and consist of sequentially located phases having different strength. The interfaces had toothed, needled of plane profiles that depended on chemical content and structure of substrate as well as on surface impregnation modes. Different interface profiles were obtained on structural (3% Ni, - 1% Mo) and low-carbon steel specimens.
UR - http://www.scopus.com/inward/record.url?scp=84960926703&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84960926703&partnerID=8YFLogxK
U2 - 10.1109/MTT.2001.983742
DO - 10.1109/MTT.2001.983742
M3 - Conference contribution
SN - 0780363469
SN - 9780780363465
SP - 79
EP - 81
BT - Proceedings of the 7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2001
PB - Institute of Electrical and Electronics Engineers Inc.
ER -