Investigation of behaviour of surface hardened steels with different interface profiles under tension

A. V. Koval, S. V. Panin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The difference in mechanical characteristics of coating and matrix, the presence of transition layers and different geometry of the interface profile define the different character of emergence of stress mesoconcentrators at the interface, the way of their relaxation, the type of mesostructure formed as well as the nature of development of plastic deformation of the whole composition at the mesoscale level.

Original languageEnglish
Title of host publicationProceedings of the 7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2001
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages75-77
Number of pages3
ISBN (Print)0780363469, 9780780363465
DOIs
Publication statusPublished - 2001
Event7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists on Modern Techniques and Technology, MTT 2001 - Tomsk, Russian Federation
Duration: 26 Feb 20012 Mar 2001

Other

Other7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists on Modern Techniques and Technology, MTT 2001
CountryRussian Federation
CityTomsk
Period26.2.012.3.01

    Fingerprint

ASJC Scopus subject areas

  • Biotechnology
  • Computer Science Applications
  • Civil and Structural Engineering
  • Mechanical Engineering
  • Materials Science (miscellaneous)
  • Instrumentation
  • Education

Cite this

Koval, A. V., & Panin, S. V. (2001). Investigation of behaviour of surface hardened steels with different interface profiles under tension. In Proceedings of the 7th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2001 (pp. 75-77). [983740] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MTT.2001.983740