Abstract
The paper presents the results of object visualization with the laser monitor system at different distances between the object and the brightness amplifer. In spite of the fact that CuBr-laser active medium has a high gain and works in a saturation mode, an increase in distance leads to a signifcant reduction of the image contrast. At a distance of more than 4 m the image becomes indistinguishable. To increase the maximum distance between the object and the brightness amplifer the laser monitor with a plane-parallel quartz plate is used. Also theoretical and experimental dependences for the feld of view of the active optical system on the distance between the object and the brightness amplifer (laser monitor, laser projection microscope) have been studied.
| Original language | English |
|---|---|
| Title of host publication | International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM |
| Publisher | IEEE Computer Society |
| Pages | 321-324 |
| Number of pages | 4 |
| Volume | 2015-August |
| ISBN (Print) | 9781467367196 |
| DOIs | |
| Publication status | Published - 10 Aug 2015 |
| Event | 16th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2015 - Erlagol, Altai, Russian Federation Duration: 29 Jun 2015 → 3 Jul 2015 |
Other
| Other | 16th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2015 |
|---|---|
| Country | Russian Federation |
| City | Erlagol, Altai |
| Period | 29.6.15 → 3.7.15 |
Fingerprint
Keywords
- AOS
- CVL
- Laser projection microscope
- monitoring
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Atomic and Molecular Physics, and Optics
Cite this
Investigation of active optical systems for remote object visualization. / Trigub, Maxim Victorovich; Fedorov, Kirill V.; Evtushenko, Gennadii S.
International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM. Vol. 2015-August IEEE Computer Society, 2015. p. 321-324 7184554.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Investigation of active optical systems for remote object visualization
AU - Trigub, Maxim Victorovich
AU - Fedorov, Kirill V.
AU - Evtushenko, Gennadii S.
PY - 2015/8/10
Y1 - 2015/8/10
N2 - The paper presents the results of object visualization with the laser monitor system at different distances between the object and the brightness amplifer. In spite of the fact that CuBr-laser active medium has a high gain and works in a saturation mode, an increase in distance leads to a signifcant reduction of the image contrast. At a distance of more than 4 m the image becomes indistinguishable. To increase the maximum distance between the object and the brightness amplifer the laser monitor with a plane-parallel quartz plate is used. Also theoretical and experimental dependences for the feld of view of the active optical system on the distance between the object and the brightness amplifer (laser monitor, laser projection microscope) have been studied.
AB - The paper presents the results of object visualization with the laser monitor system at different distances between the object and the brightness amplifer. In spite of the fact that CuBr-laser active medium has a high gain and works in a saturation mode, an increase in distance leads to a signifcant reduction of the image contrast. At a distance of more than 4 m the image becomes indistinguishable. To increase the maximum distance between the object and the brightness amplifer the laser monitor with a plane-parallel quartz plate is used. Also theoretical and experimental dependences for the feld of view of the active optical system on the distance between the object and the brightness amplifer (laser monitor, laser projection microscope) have been studied.
KW - AOS
KW - CVL
KW - Laser projection microscope
KW - monitoring
UR - http://www.scopus.com/inward/record.url?scp=84953373576&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84953373576&partnerID=8YFLogxK
U2 - 10.1109/EDM.2015.7184554
DO - 10.1109/EDM.2015.7184554
M3 - Conference contribution
SN - 9781467367196
VL - 2015-August
SP - 321
EP - 324
BT - International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM
PB - IEEE Computer Society
ER -