Abstract
The aim of the paper is to describe the international activity in the field of thermal nondestructive control. It is noted that the interest in the active thermal testing (ATT), requiring the additional thermal stimulation of the tested objects, increased essentially during last 30 years. The activity of the International Conferences on ATT during last 10 years is described briefly. A list of the forthcoming International Conferences on ATT is given.
Original language | English |
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Pages (from-to) | 97-99 |
Number of pages | 3 |
Journal | Defektoskopiya |
Issue number | 7 |
Publication status | Published - 2001 |
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ASJC Scopus subject areas
- Engineering(all)
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International activity and the forthcoming Conferences in the field of thermal nondestructive testing. / Vavilov, V. P.
In: Defektoskopiya, No. 7, 2001, p. 97-99.Research output: Contribution to journal › Article
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TY - JOUR
T1 - International activity and the forthcoming Conferences in the field of thermal nondestructive testing
AU - Vavilov, V. P.
PY - 2001
Y1 - 2001
N2 - The aim of the paper is to describe the international activity in the field of thermal nondestructive control. It is noted that the interest in the active thermal testing (ATT), requiring the additional thermal stimulation of the tested objects, increased essentially during last 30 years. The activity of the International Conferences on ATT during last 10 years is described briefly. A list of the forthcoming International Conferences on ATT is given.
AB - The aim of the paper is to describe the international activity in the field of thermal nondestructive control. It is noted that the interest in the active thermal testing (ATT), requiring the additional thermal stimulation of the tested objects, increased essentially during last 30 years. The activity of the International Conferences on ATT during last 10 years is described briefly. A list of the forthcoming International Conferences on ATT is given.
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UR - http://www.scopus.com/inward/citedby.url?scp=0035773803&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:0035773803
SP - 97
EP - 99
JO - Defektoskopiya
JF - Defektoskopiya
SN - 0130-3082
IS - 7
ER -