Intelligent learning and testing system for students training in the problem area of nanotechnology and microsystem engineering

D. Lyapunov, A. Yankovskaya, Y. Dementyev, K. Negodin

Research output: Contribution to journalConference article

Abstract

For the students learning and training in the field of nanotechnology and microsystem engineering within the framework of blended learning paradigm we need high quality content; efficient learning technology; means of students motivation; evaluation tools. We propose an intelligent learning and testing system based on mixed diagnostic tests for effective comprehension of a number of subjects within the problem area. The system allows to provide effective comprehension of a number of subjects and to form the primary competences from the students point of view, revealing their future occupation preferences. During the learning process the students within small groups (not less than 4 students) solve the problems of development, modelling and design of microsystem devices. They also investigate the market needs, consider the opportunities of macroscopic sensors and actuators exchange on their microsystem analogs.

Original languageEnglish
Pages (from-to)69-73
Number of pages5
JournalCEUR Workshop Proceedings
Volume1900
DOIs
Publication statusPublished - 1 Jan 2017
Event2017 International Conference Information Technology and Nanotechnology. Session Computer Optics and Nanophotonics, CON-ITNT 2017 - Samara, Russian Federation
Duration: 24 Apr 201727 Apr 2017

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Keywords

  • Blended learning
  • Competences
  • Intelligent learning and testing system
  • Learning technology
  • Microsystem engineering
  • Mixed diagnostic test
  • Multidisciplinary course
  • Nanotechnology

ASJC Scopus subject areas

  • Computer Science(all)

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