Influence of the Flux Peaking Effect on the DD Reaction Yield Upon D+ Ion Channelling in Deuterated Palladium

O. D. Dalkarov, M. A. Negodaev, A. S. Rusetskii, A. P. Chubenko, Yu L. Pivovarov, T. A. Tukhfatullin

Research output: Contribution to journalArticlepeer-review

Abstract

Abstract: The interaction between a deuterium ion (D+) beam and deuterium-enriched Pd and Ti targets are studied using the HELIS ion accelerator (Lebedev Physical Institute). The neutron yield is determined from the DD reaction in the deuterated Pd target whose surface is irradiated with a D+-ion beam with an energy of 20 keV. The neutron flux is measured in the D+-ion-beam direction as a function of the angle β of target rotation relative to the beam axis using a multichannel detector based on 3He counters. Significant anisotropy (orientation effect) of the neutron yield is observed; it is two times higher at β = 0° than at β = ±30°. The orientation effect can be associated with channeling and the so-called flux-peaking effect. It is studied by computer simulations using the BCM-2.0 code. The enhanced density of the D+ flux between the (200) planes of a Pd crystal (where implanted D is located) at zero angle of incidence with respect to these planes makes it possible to qualitatively explain the observed orientation effect. No effect is observed in a homogeneous target of deuterated titanium.

Original languageEnglish
Pages (from-to)220-225
Number of pages6
JournalJournal of Surface Investigation
Volume14
Issue number2
DOIs
Publication statusPublished - 1 Mar 2020

Keywords

  • channeling of ions in crystals
  • DD-reaction yield
  • interaction of neutrons with matter
  • ion accelerator
  • neutron detector
  • planar channeling

ASJC Scopus subject areas

  • Surfaces, Coatings and Films

Fingerprint Dive into the research topics of 'Influence of the Flux Peaking Effect on the DD Reaction Yield Upon D<sup>+</sup> Ion Channelling in Deuterated Palladium'. Together they form a unique fingerprint.

Cite this