INFLUENCE OF THE COLLECTOR ELECTRIC FIELD ON PROCESSES OCCURRING IN A FORMED METAL-INSULATOR-METAL SYSTEM.

G. A. Vorob'yev, S. A. Gyngazov, R. B. Lubsanov

Research output: Contribution to journalArticle

Abstract

To remove the electrons, emitted by an MIM cathode (or a formed metal-insulator-metal system), a collector (or anode) is placed beneath the latter. The anode field E//a equals U//a/d//a (U//a is the anode voltage and d//a is the distance between the anode surface and the surface of the MIM cathode) usually does not exceed 10**3 V/cm, whereas the field in the formed channel, resulting from the forming process, from which electron emission occurs, is of the order of E//c approximately equals 10**6 V/cm according to crude estimates. It is of interest to trace the influence of E//a, where it approaches E//c, on the processes occurring in the formed MIM system.

Original languageEnglish
Pages (from-to)179-181
Number of pages3
JournalSoviet journal of communications technology & electronics
Volume32
Issue number7
Publication statusPublished - Jul 1987

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Anodes
Electric fields
Metals
Cathodes
Electron emission
Electrons
Electric potential

ASJC Scopus subject areas

  • Engineering(all)

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INFLUENCE OF THE COLLECTOR ELECTRIC FIELD ON PROCESSES OCCURRING IN A FORMED METAL-INSULATOR-METAL SYSTEM. / Vorob'yev, G. A.; Gyngazov, S. A.; Lubsanov, R. B.

In: Soviet journal of communications technology & electronics, Vol. 32, No. 7, 07.1987, p. 179-181.

Research output: Contribution to journalArticle

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