Influence of temperature on parametric x-ray intensity

K. Yu Amosov, B. N. Kalinin, A. P. Potylitsin, V. P. Sarychev, S. R. Uglov, V. A. Verzilov, S. A. Vorobiev, I. Endo, T. Kobayashi

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)


We have measured the temperature dependence of parametric x-ray radiation (PXR) from a Si single crystal bombarded by 900-MeV electrons. The radiation intensity is appreciably enhanced when the crystal is cooled to liquid-nitrogen temperature as compared with the case for room temperature. The enhancement factors are larger for the higher-order reflections and are quantitatively consistent with the assumption that the PXR intensities are proportional to the squared Debye-Waller factor.

Original languageEnglish
Pages (from-to)2207-2209
Number of pages3
JournalPhysical Review E
Issue number3
Publication statusPublished - 1993

ASJC Scopus subject areas

  • Statistical and Nonlinear Physics
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Mathematical Physics

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