Influence of prehistory on properties of PVDF films

Abstract

Study of the main properties of polyvinylidene fluoride (PVDF) films produced by two processing technologies such as hot pressing from a melt or solution casting was the aim of this paper. To characterize properties of samples, different experimental methods such as FRA (dielectric spectroscopy), IR-spectroscopy and DSC/TGA analysis were used in this work. It was found that the beginning melting temperature, the melting point, the beginning decomposition temperature, and the decomposition temperature for samples prepared by hot pressing method decrease by 8, 2, 10 and 12°C, respectively, compared to those for samples prepared by a solution casting.

Original language	English
Title of host publication	Proceedings - 2012 7th International Forum on Strategic Technology, IFOST 2012
DOIs	https://doi.org/10.1109/IFOST.2012.6357799
Publication status	Published - 2012
Event	2012 7th International Forum on Strategic Technology, IFOST 2012 - Tomsk, Russian Federation Duration: 18 Sep 2012 → 21 Sep 2012

Other

Other	2012 7th International Forum on Strategic Technology, IFOST 2012
Country	Russian Federation
City	Tomsk
Period	18.9.12 → 21.9.12

Keywords

electrical
PVDF
thermal and molecular properties

ASJC Scopus subject areas

Management of Technology and Innovation

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title = "Influence of prehistory on properties of PVDF films",

abstract = "Study of the main properties of polyvinylidene fluoride (PVDF) films produced by two processing technologies such as hot pressing from a melt or solution casting was the aim of this paper. To characterize properties of samples, different experimental methods such as FRA (dielectric spectroscopy), IR-spectroscopy and DSC/TGA analysis were used in this work. It was found that the beginning melting temperature, the melting point, the beginning decomposition temperature, and the decomposition temperature for samples prepared by hot pressing method decrease by 8, 2, 10 and 12°C, respectively, compared to those for samples prepared by a solution casting.",

keywords = "electrical, PVDF, thermal and molecular properties",

author = "Lebedev, {S. M.} and Gefle, {O. S.}",

year = "2012",

doi = "10.1109/IFOST.2012.6357799",

language = "English",

isbn = "9781467317702",

booktitle = "Proceedings - 2012 7th International Forum on Strategic Technology, IFOST 2012",

note = "2012 7th International Forum on Strategic Technology, IFOST 2012 ; Conference date: 18-09-2012 Through 21-09-2012",

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AU - Lebedev, S. M.

AU - Gefle, O. S.

PY - 2012

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N2 - Study of the main properties of polyvinylidene fluoride (PVDF) films produced by two processing technologies such as hot pressing from a melt or solution casting was the aim of this paper. To characterize properties of samples, different experimental methods such as FRA (dielectric spectroscopy), IR-spectroscopy and DSC/TGA analysis were used in this work. It was found that the beginning melting temperature, the melting point, the beginning decomposition temperature, and the decomposition temperature for samples prepared by hot pressing method decrease by 8, 2, 10 and 12°C, respectively, compared to those for samples prepared by a solution casting.

AB - Study of the main properties of polyvinylidene fluoride (PVDF) films produced by two processing technologies such as hot pressing from a melt or solution casting was the aim of this paper. To characterize properties of samples, different experimental methods such as FRA (dielectric spectroscopy), IR-spectroscopy and DSC/TGA analysis were used in this work. It was found that the beginning melting temperature, the melting point, the beginning decomposition temperature, and the decomposition temperature for samples prepared by hot pressing method decrease by 8, 2, 10 and 12°C, respectively, compared to those for samples prepared by a solution casting.

KW - electrical

KW - PVDF

KW - thermal and molecular properties

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DO - 10.1109/IFOST.2012.6357799

M3 - Conference contribution

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SN - 9781467317702

BT - Proceedings - 2012 7th International Forum on Strategic Technology, IFOST 2012

T2 - 2012 7th International Forum on Strategic Technology, IFOST 2012

Y2 - 18 September 2012 through 21 September 2012

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