Influence of heterogeneity solid dielectrics on time up to breakdown

M. U. Zhurkov, A. A. Chernak

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

When performing research of failures of high-voltage electric insulating products, isolators etc. it is necessary to use methods of statistical analysis in processing experimental data, finding the function of distribution of failures probabilities being of great importance. Using a computer model, statistical research of isolation failures were carried out for a narrow spectrum of change of the defects characteristics, that is practically for all samples with identical defects in all volume of a sample. The distribution failure probability on the Weibull's diagram is represented by one direct line for any narrow class of defects. The use of the computer model of solid dielectrics aging and breakdown of solid dielectrics under long influence of an electrical field allows study of both statistical and physical laws of dielectrics breakdown. In particular, it expands and deepens the understanding of defect influence on the internal structure of the solid insulator on the time up to breakdown.

Original languageEnglish
Title of host publicationProceedings of the 6th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2000
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages174-175
Number of pages2
ISBN (Print)0780357892, 9780780357891
DOIs
Publication statusPublished - 2000
Event6th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2000 - Tomsk, Russian Federation
Duration: 28 Feb 20003 Mar 2000

Other

Other6th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2000
CountryRussian Federation
CityTomsk
Period28.2.003.3.00

Fingerprint

Defects
Electric breakdown
Statistical methods
Aging of materials
Electric potential
Processing
Statistical Models

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Zhurkov, M. U., & Chernak, A. A. (2000). Influence of heterogeneity solid dielectrics on time up to breakdown. In Proceedings of the 6th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2000 (pp. 174-175). [896105] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SPCMTT.2000.896105

Influence of heterogeneity solid dielectrics on time up to breakdown. / Zhurkov, M. U.; Chernak, A. A.

Proceedings of the 6th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2000. Institute of Electrical and Electronics Engineers Inc., 2000. p. 174-175 896105.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Zhurkov, MU & Chernak, AA 2000, Influence of heterogeneity solid dielectrics on time up to breakdown. in Proceedings of the 6th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2000., 896105, Institute of Electrical and Electronics Engineers Inc., pp. 174-175, 6th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2000, Tomsk, Russian Federation, 28.2.00. https://doi.org/10.1109/SPCMTT.2000.896105
Zhurkov MU, Chernak AA. Influence of heterogeneity solid dielectrics on time up to breakdown. In Proceedings of the 6th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2000. Institute of Electrical and Electronics Engineers Inc. 2000. p. 174-175. 896105 https://doi.org/10.1109/SPCMTT.2000.896105
Zhurkov, M. U. ; Chernak, A. A. / Influence of heterogeneity solid dielectrics on time up to breakdown. Proceedings of the 6th International Scientific and Practical Conference of Students, Post-Graduates and Young Scientists: Modern Techniques and Technology, MTT 2000. Institute of Electrical and Electronics Engineers Inc., 2000. pp. 174-175
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