Influence of hardened layer structure and coating-substrate interface geometry on plastic deformation pattern of structural steels at mesolevel

A. Koval, S. Panin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Using the television-optical measuring technique, TOMSC-1, investigations of mesoscale deformation patterns of surface-hardened structural steels were carried out. Surface hardening was performed by diffusion boriding to produce a hardened layer with a discrete structure and complex interface profile. Mesoband length, as well as the character of mesostructure formed in the substrate, are defined by crack relative position that, in turn, depends on interface profile.

Original languageEnglish
Title of host publicationProceedings - KORUS 2000: 4th Korea-Russia International Symposium on Science and Technology
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages375-380
Number of pages6
Volume3
ISBN (Print)0780364864, 9780780364868
DOIs
Publication statusPublished - 2000
Event4th Korea-Russia International Symposium on Science and Technology, KORUS 2000 - Ulsan, Korea, Republic of
Duration: 27 Jun 20001 Jul 2000

Other

Other4th Korea-Russia International Symposium on Science and Technology, KORUS 2000
CountryKorea, Republic of
CityUlsan
Period27.6.001.7.00

Keywords

  • borating
  • interface
  • mesolevel
  • mesostructure
  • stress concentrator

ASJC Scopus subject areas

  • Clinical Biochemistry
  • Computer Networks and Communications
  • Biotechnology
  • Civil and Structural Engineering
  • Mechanics of Materials
  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Surfaces, Coatings and Films

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  • Cite this

    Koval, A., & Panin, S. (2000). Influence of hardened layer structure and coating-substrate interface geometry on plastic deformation pattern of structural steels at mesolevel. In Proceedings - KORUS 2000: 4th Korea-Russia International Symposium on Science and Technology (Vol. 3, pp. 375-380). [866117] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/KORUS.2000.866117