Influence of applied oscillation mode at nanopowder ultrasonic compaction on Y-TZP nanoceramics properties

O. L. Khasanov, J. S. Lee, Yu P. Pokholkov, V. M. Sokolov, E. S. Dvilis, Z. G. Bikbaeva, V. V. Polisadova, V. K. Strutz, M. S. Kim, B. G. An

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

The properties of the green compacts from (ZrO2-5% Y2O3) ultrafine powders (UFP) compacted under action of ultrasonic oscillations (USO), which were supplied perpendicularly and parallel to pressing axis have been studied. The distinctions of such properties as density, granularity, hardness and fracture toughness of ceramics sintered from the compacts of both types are shown.

Original languageEnglish
Title of host publicationProceedings - 3rd Russian-Korean International Symposium on Science and Technology, KORUS 1999
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages561-564
Number of pages4
Volume2
ISBN (Electronic)0780357299, 9780780357297
DOIs
Publication statusPublished - 1 Jan 1999
Event3rd Russian-Korean International Symposium on Science and Technology, KORUS 1999 - Novosibirsk, Russian Federation
Duration: 22 Jun 199925 Jun 1999

Conference

Conference3rd Russian-Korean International Symposium on Science and Technology, KORUS 1999
CountryRussian Federation
CityNovosibirsk
Period22.6.9925.6.99

Fingerprint

Nanopowder
Compaction
Fracture toughness
Ultrasonics
Hardness
Oscillation
Powders
Fracture Toughness
Granularity
Powder
Influence
Pressing

ASJC Scopus subject areas

  • Marketing
  • Strategy and Management
  • Computer Science Applications
  • Computer Networks and Communications
  • Management Science and Operations Research
  • Numerical Analysis

Cite this

Khasanov, O. L., Lee, J. S., Pokholkov, Y. P., Sokolov, V. M., Dvilis, E. S., Bikbaeva, Z. G., ... An, B. G. (1999). Influence of applied oscillation mode at nanopowder ultrasonic compaction on Y-TZP nanoceramics properties. In Proceedings - 3rd Russian-Korean International Symposium on Science and Technology, KORUS 1999 (Vol. 2, pp. 561-564). [876227] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/KORUS.1999.876227

Influence of applied oscillation mode at nanopowder ultrasonic compaction on Y-TZP nanoceramics properties. / Khasanov, O. L.; Lee, J. S.; Pokholkov, Yu P.; Sokolov, V. M.; Dvilis, E. S.; Bikbaeva, Z. G.; Polisadova, V. V.; Strutz, V. K.; Kim, M. S.; An, B. G.

Proceedings - 3rd Russian-Korean International Symposium on Science and Technology, KORUS 1999. Vol. 2 Institute of Electrical and Electronics Engineers Inc., 1999. p. 561-564 876227.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Khasanov, OL, Lee, JS, Pokholkov, YP, Sokolov, VM, Dvilis, ES, Bikbaeva, ZG, Polisadova, VV, Strutz, VK, Kim, MS & An, BG 1999, Influence of applied oscillation mode at nanopowder ultrasonic compaction on Y-TZP nanoceramics properties. in Proceedings - 3rd Russian-Korean International Symposium on Science and Technology, KORUS 1999. vol. 2, 876227, Institute of Electrical and Electronics Engineers Inc., pp. 561-564, 3rd Russian-Korean International Symposium on Science and Technology, KORUS 1999, Novosibirsk, Russian Federation, 22.6.99. https://doi.org/10.1109/KORUS.1999.876227
Khasanov OL, Lee JS, Pokholkov YP, Sokolov VM, Dvilis ES, Bikbaeva ZG et al. Influence of applied oscillation mode at nanopowder ultrasonic compaction on Y-TZP nanoceramics properties. In Proceedings - 3rd Russian-Korean International Symposium on Science and Technology, KORUS 1999. Vol. 2. Institute of Electrical and Electronics Engineers Inc. 1999. p. 561-564. 876227 https://doi.org/10.1109/KORUS.1999.876227
Khasanov, O. L. ; Lee, J. S. ; Pokholkov, Yu P. ; Sokolov, V. M. ; Dvilis, E. S. ; Bikbaeva, Z. G. ; Polisadova, V. V. ; Strutz, V. K. ; Kim, M. S. ; An, B. G. / Influence of applied oscillation mode at nanopowder ultrasonic compaction on Y-TZP nanoceramics properties. Proceedings - 3rd Russian-Korean International Symposium on Science and Technology, KORUS 1999. Vol. 2 Institute of Electrical and Electronics Engineers Inc., 1999. pp. 561-564
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