Abstract
By analyzing the operation of infrared devices that perform the function of thermal flaw detectors, relationships have been derived which make it possible to evaluate the signal-to-noise ratio in various spectral intervals.
| Original language | English |
|---|---|
| Pages (from-to) | 577-581 |
| Number of pages | 5 |
| Journal | The Soviet journal of nondestructive testing |
| Volume | 21 |
| Issue number | 8 |
| Publication status | Published - Aug 1985 |
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ASJC Scopus subject areas
- Engineering(all)