The investigation results of elemental and phase composition, state of defective substructure and microhardness of the surface layer of film (Ti)/substrate (SiC-ceramics) system (Ti film 0.5 μm thick was deposited on the surface of SiC-ceramics) subjected to treatment with an intense pulsed low-energy electron beam (15 J/cm2, 200 μs, 0.3 s-1, 20 pulses) are presented. It is shown that irradiation of the film (Ti)/substrate (SiC-ceramics) system with an electron beam is accompanied by the formation of multielement multiphase (SiC; TiC; Ti5Si3) surface layer having submicro- and nanocrystalline structure. Microhardness of the irradiated surface layer reaches a value of 74 GPa, that is twice the value of microhardness of SiC-ceramics (36 GPa).
|Journal||IOP Conference Series: Materials Science and Engineering|
|Publication status||Published - 20 Jan 2020|
|Event||International Science and Technology Conference for Youth on Advanced Materials for Engineering and Medicine, AMEM 2019 - Tomsk, Russian Federation|
Duration: 30 Sep 2019 → 5 Oct 2019
ASJC Scopus subject areas
- Materials Science(all)