Imaging by means of the bistatic laser monitor

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The intensive development of beam, plasma, discharge and laser technologies makes non-destructive testing methods and devices based on passive and active optical systems. There is an active optical system, which is called a laser monitor. The using of this system makes it possible to form images of test objects and processes suitable for analysis even under background radiation, however, the imaging distance does not exceed 3.3 m. The bistatic scheme of the laser monitor is designed to expand the capabilities of imaging using active media on metal vapors. This paper shows the operation features of the bistatic laser monitor as well as the parameters of the formed images. One of the issue is to compare the amplification of image brightness in an optical converter due to the different laser monitor scheme modification.

Original languageEnglish
Title of host publicationXIV International Conference on Pulsed Lasers and Laser Applications
EditorsVictor F. Tarasenko, Anton V. Klimkin, Maxim V. Trigub
PublisherSPIE
ISBN (Electronic)9781510634114
DOIs
Publication statusPublished - 2019
Externally publishedYes
EventXIV International Conference on Pulsed Lasers and Laser Applications, AMPL 2019 - Tomsk, Russian Federation
Duration: 15 Sep 201920 Sep 2019

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11322
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceXIV International Conference on Pulsed Lasers and Laser Applications, AMPL 2019
CountryRussian Federation
CityTomsk
Period15.9.1920.9.19

Keywords

  • Amplifier.
  • Background light
  • Bistatic laser monitor
  • CuBr-laser
  • High-speed processes
  • Imaging
  • Monostatic laser monitor

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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