Hypereutectic silumin modification by ion-electron-plasma method

M. E. Rygina, Yu F. Ivanov, A. P. Laskovnev, A. D. Teresov, N. N. Cherenda, V. V. Uglov, E. A. Petrikova

Research output: Contribution to journalConference article

Abstract

In this paper, hypereutectic silumin (22-24 wt/%) was used. The structure was studied before modification. It is represented by primary silicon grains with a size of about 100 μm. Intermetallic compounds are also non-uniform distributed. After modification by an electron beam, the crystallite size was 0.4-0.5 μm. There are several layers. The modification depth was 130 μm. Hardness increased in 1.7 times, wear resistance in 1.2 times. Also, in this paper, data was given on the variation of the elementary composition with respect to the depth of the sample. The film was melt into the surface of the sample by an electron beam after depositing. The hardness increased by 1.7 times, the wear resistance increased in 2.6 times in comparison with the untreated samples. The coefficient of friction was 0.39.

Original languageEnglish
Article number032054
JournalJournal of Physics: Conference Series
Volume1115
Issue number3
DOIs
Publication statusPublished - 27 Nov 2018
Event6th International Congress on Energy Fluxes and Radiation Effects 2018, EFRE 2018 - Tomsk, Russian Federation
Duration: 16 Sep 201822 Sep 2018

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electron plasma
wear resistance
hardness
electron beams
ions
coefficient of friction
intermetallics
silicon

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Hypereutectic silumin modification by ion-electron-plasma method. / Rygina, M. E.; Ivanov, Yu F.; Laskovnev, A. P.; Teresov, A. D.; Cherenda, N. N.; Uglov, V. V.; Petrikova, E. A.

In: Journal of Physics: Conference Series, Vol. 1115, No. 3, 032054, 27.11.2018.

Research output: Contribution to journalConference article

Rygina, M. E. ; Ivanov, Yu F. ; Laskovnev, A. P. ; Teresov, A. D. ; Cherenda, N. N. ; Uglov, V. V. ; Petrikova, E. A. / Hypereutectic silumin modification by ion-electron-plasma method. In: Journal of Physics: Conference Series. 2018 ; Vol. 1115, No. 3.
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AU - Cherenda, N. N.

AU - Uglov, V. V.

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