High-power critical electron emission from dielectric induced by high-current-density electron beam injection and its transition to vacuum breakdown

D Vaisburd, Sergey Tverdokhlebov, Timur Akhatovich Tukhfatullin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Since 1975 our lab has been investigating the critical electron emission from dielectrics into vacuum with nanosecond time resolution using high-current-density electron accelerators. It allowed us to clear up some intrinsic properties of the critical electron emission induced by electron beam injection: (1) The emission pulse is delayed for several nanoseconds from the injection one. (2) The peak value of the emission current reaches 100-1000 A. (3) The direct experimental evidence is obtained for intense electron-hole generation by superhigh electric field in subsurface layer of dielectric. And this process is discovered to be the main reason of the transition to critical electron emission. (4) Critical emission is not uniform and accompanied by point explosions on the dielectric surface and by injections of ion plasmas from these points into vacuum. (5) Transition of critical emission to vacuum breakdown has been observed.

Original languageEnglish
Title of host publicationInternational Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV
Place of PublicationPiscataway, NJ, United States
PublisherIEEE
Pages435-438
Number of pages4
Volume1
ISBN (Print)0-7803-2906-6
Publication statusPublished - 1996
EventProceedings of the 1996 17th International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV. Part 1 (of 2) - Berkeley, CA, USA
Duration: 21 Jul 199626 Jul 1996

Other

OtherProceedings of the 1996 17th International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV. Part 1 (of 2)
CityBerkeley, CA, USA
Period21.7.9626.7.96

Fingerprint

Electron emission
Electron beams
Current density
Vacuum
Electron transitions
Explosions
Particle accelerators
Electric fields
Plasmas
Electrons
Ions

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Vaisburd, D., Tverdokhlebov, S., & Tukhfatullin, T. A. (1996). High-power critical electron emission from dielectric induced by high-current-density electron beam injection and its transition to vacuum breakdown. In International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV (Vol. 1, pp. 435-438). Piscataway, NJ, United States: IEEE.

High-power critical electron emission from dielectric induced by high-current-density electron beam injection and its transition to vacuum breakdown. / Vaisburd, D; Tverdokhlebov, Sergey; Tukhfatullin, Timur Akhatovich.

International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV. Vol. 1 Piscataway, NJ, United States : IEEE, 1996. p. 435-438.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Vaisburd, D, Tverdokhlebov, S & Tukhfatullin, TA 1996, High-power critical electron emission from dielectric induced by high-current-density electron beam injection and its transition to vacuum breakdown. in International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV. vol. 1, IEEE, Piscataway, NJ, United States, pp. 435-438, Proceedings of the 1996 17th International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV. Part 1 (of 2), Berkeley, CA, USA, 21.7.96.
Vaisburd D, Tverdokhlebov S, Tukhfatullin TA. High-power critical electron emission from dielectric induced by high-current-density electron beam injection and its transition to vacuum breakdown. In International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV. Vol. 1. Piscataway, NJ, United States: IEEE. 1996. p. 435-438
Vaisburd, D ; Tverdokhlebov, Sergey ; Tukhfatullin, Timur Akhatovich. / High-power critical electron emission from dielectric induced by high-current-density electron beam injection and its transition to vacuum breakdown. International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV. Vol. 1 Piscataway, NJ, United States : IEEE, 1996. pp. 435-438
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