High-Energy X-ray Radiation Registration Model

S. P. Osipov, O. S. Osipov, K. V. Ignatenko

Research output: Contribution to journalArticle

Abstract

It is proved the necessity for carrying out computing experiments according to the mean value and the square of registered X-ray photons absorbed energy of in a scintillation detector. The offered imitation model of the transfer and registration of high-energy X-ray radiation in a sensing volume of CsI and CdWO4 scintillation detectors is based on a Monte Carlo method. The model considers leakage of secondary photons and electrons. It is offered approaches to justification of adequacy of the developed model of a high-energy X-ray radiation registration.

Original languageEnglish
Article number012035
JournalIOP Conference Series: Materials Science and Engineering
Volume189
Issue number1
DOIs
Publication statusPublished - 18 Apr 2017
Event5th International Conference on Modern Technologies for Non-Destructive Testing - Tomsk, Russian Federation
Duration: 3 Oct 20168 Oct 2016

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Scintillation counters
Radiation
X rays
Photons
Monte Carlo methods
Electrons
Experiments

ASJC Scopus subject areas

  • Materials Science(all)
  • Engineering(all)

Cite this

High-Energy X-ray Radiation Registration Model. / Osipov, S. P.; Osipov, O. S.; Ignatenko, K. V.

In: IOP Conference Series: Materials Science and Engineering, Vol. 189, No. 1, 012035, 18.04.2017.

Research output: Contribution to journalArticle

@article{c37d8010df4f464e8165aadc7fdb5ff1,
title = "High-Energy X-ray Radiation Registration Model",
abstract = "It is proved the necessity for carrying out computing experiments according to the mean value and the square of registered X-ray photons absorbed energy of in a scintillation detector. The offered imitation model of the transfer and registration of high-energy X-ray radiation in a sensing volume of CsI and CdWO4 scintillation detectors is based on a Monte Carlo method. The model considers leakage of secondary photons and electrons. It is offered approaches to justification of adequacy of the developed model of a high-energy X-ray radiation registration.",
author = "Osipov, {S. P.} and Osipov, {O. S.} and Ignatenko, {K. V.}",
year = "2017",
month = "4",
day = "18",
doi = "10.1088/1757-899X/189/1/012035",
language = "English",
volume = "189",
journal = "IOP Conference Series: Materials Science and Engineering",
issn = "1757-8981",
publisher = "IOP Publishing Ltd.",
number = "1",

}

TY - JOUR

T1 - High-Energy X-ray Radiation Registration Model

AU - Osipov, S. P.

AU - Osipov, O. S.

AU - Ignatenko, K. V.

PY - 2017/4/18

Y1 - 2017/4/18

N2 - It is proved the necessity for carrying out computing experiments according to the mean value and the square of registered X-ray photons absorbed energy of in a scintillation detector. The offered imitation model of the transfer and registration of high-energy X-ray radiation in a sensing volume of CsI and CdWO4 scintillation detectors is based on a Monte Carlo method. The model considers leakage of secondary photons and electrons. It is offered approaches to justification of adequacy of the developed model of a high-energy X-ray radiation registration.

AB - It is proved the necessity for carrying out computing experiments according to the mean value and the square of registered X-ray photons absorbed energy of in a scintillation detector. The offered imitation model of the transfer and registration of high-energy X-ray radiation in a sensing volume of CsI and CdWO4 scintillation detectors is based on a Monte Carlo method. The model considers leakage of secondary photons and electrons. It is offered approaches to justification of adequacy of the developed model of a high-energy X-ray radiation registration.

UR - http://www.scopus.com/inward/record.url?scp=85018414355&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85018414355&partnerID=8YFLogxK

U2 - 10.1088/1757-899X/189/1/012035

DO - 10.1088/1757-899X/189/1/012035

M3 - Article

AN - SCOPUS:85018414355

VL - 189

JO - IOP Conference Series: Materials Science and Engineering

JF - IOP Conference Series: Materials Science and Engineering

SN - 1757-8981

IS - 1

M1 - 012035

ER -