Abstract
A method of an optical diffraction radiation technique based on the phase shift on the slit target, consisting on the two semi-planes which are turned at a some angle one to other is suggested. The method of suppression of the pre-wave zone effect contribution is shown. This allows to realize the non-invasive measurements of transverse size of supper-relativistic electron beams with the small emittance for the single bunch diagnostics. Last time a few techniques for measuring an electron beam size as small as 10 μ with resolution of 1 μ are being developed at the accelerator installations with different beam energies. However, a simple noninvasive method for beam-size measurement with a single shot is still absent.
| Original language | English |
|---|---|
| Title of host publication | RuPAC 2006 Contributions to the Proceedings - 20th Russian Conference on Charged Particle Accelerators |
| Pages | 46-48 |
| Number of pages | 3 |
| Publication status | Published - 2006 |
| Event | 20th Russian Conference on Charged Particle Accelerators, RuPAC 2006 - Novosibirsk, Russian Federation Duration: 10 Sep 2006 → 14 Sep 2006 |
Other
| Other | 20th Russian Conference on Charged Particle Accelerators, RuPAC 2006 |
|---|---|
| Country | Russian Federation |
| City | Novosibirsk |
| Period | 10.9.06 → 14.9.06 |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
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Cite this
Naumenko, G., Potylitsyn, A., & Sukhikh, L. (2006). High energy micron electron beam non-invasive diagnostics based on diffraction radiation. In RuPAC 2006 Contributions to the Proceedings - 20th Russian Conference on Charged Particle Accelerators (pp. 46-48)