High energy micron electron beam non-invasive diagnostics based on diffraction radiation

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A method of an optical diffraction radiation technique based on the phase shift on the slit target, consisting on the two semi-planes which are turned at a some angle one to other is suggested. The method of suppression of the pre-wave zone effect contribution is shown. This allows to realize the non-invasive measurements of transverse size of supper-relativistic electron beams with the small emittance for the single bunch diagnostics. Last time a few techniques for measuring an electron beam size as small as 10 μ with resolution of 1 μ are being developed at the accelerator installations with different beam energies. However, a simple noninvasive method for beam-size measurement with a single shot is still absent.

Original languageEnglish
Title of host publicationRuPAC 2006 Contributions to the Proceedings - 20th Russian Conference on Charged Particle Accelerators
Pages46-48
Number of pages3
Publication statusPublished - 2006
Event20th Russian Conference on Charged Particle Accelerators, RuPAC 2006 - Novosibirsk, Russian Federation
Duration: 10 Sep 200614 Sep 2006

Other

Other20th Russian Conference on Charged Particle Accelerators, RuPAC 2006
CountryRussian Federation
CityNovosibirsk
Period10.9.0614.9.06

Fingerprint

diffraction radiation
high energy electrons
electron beams
relativistic electron beams
emittance
shot
installing
slits
accelerators
phase shift
retarding
energy

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Naumenko, G., Potylitsyn, A., & Sukhikh, L. (2006). High energy micron electron beam non-invasive diagnostics based on diffraction radiation. In RuPAC 2006 Contributions to the Proceedings - 20th Russian Conference on Charged Particle Accelerators (pp. 46-48)

High energy micron electron beam non-invasive diagnostics based on diffraction radiation. / Naumenko, G.; Potylitsyn, A.; Sukhikh, L.

RuPAC 2006 Contributions to the Proceedings - 20th Russian Conference on Charged Particle Accelerators. 2006. p. 46-48.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Naumenko, G, Potylitsyn, A & Sukhikh, L 2006, High energy micron electron beam non-invasive diagnostics based on diffraction radiation. in RuPAC 2006 Contributions to the Proceedings - 20th Russian Conference on Charged Particle Accelerators. pp. 46-48, 20th Russian Conference on Charged Particle Accelerators, RuPAC 2006, Novosibirsk, Russian Federation, 10.9.06.
Naumenko G, Potylitsyn A, Sukhikh L. High energy micron electron beam non-invasive diagnostics based on diffraction radiation. In RuPAC 2006 Contributions to the Proceedings - 20th Russian Conference on Charged Particle Accelerators. 2006. p. 46-48
Naumenko, G. ; Potylitsyn, A. ; Sukhikh, L. / High energy micron electron beam non-invasive diagnostics based on diffraction radiation. RuPAC 2006 Contributions to the Proceedings - 20th Russian Conference on Charged Particle Accelerators. 2006. pp. 46-48
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