High energy micron electron beam non-invasive diagnostics based on diffraction radiation

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A method of an optical diffraction radiation technique based on the phase shift on the slit target, consisting on the two semi-planes which are turned at a some angle one to other is suggested. The method of suppression of the pre-wave zone effect contribution is shown. This allows to realize the non-invasive measurements of transverse size of supper-relativistic electron beams with the small emittance for the single bunch diagnostics. Last time a few techniques for measuring an electron beam size as small as 10 μ with resolution of 1 μ are being developed at the accelerator installations with different beam energies. However, a simple noninvasive method for beam-size measurement with a single shot is still absent.

Original languageEnglish
Title of host publicationRuPAC 2006 Contributions to the Proceedings - 20th Russian Conference on Charged Particle Accelerators
Pages46-48
Number of pages3
Publication statusPublished - 2006
Event20th Russian Conference on Charged Particle Accelerators, RuPAC 2006 - Novosibirsk, Russian Federation
Duration: 10 Sep 200614 Sep 2006

Other

Other20th Russian Conference on Charged Particle Accelerators, RuPAC 2006
CountryRussian Federation
CityNovosibirsk
Period10.9.0614.9.06

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Naumenko, G., Potylitsyn, A., & Sukhikh, L. (2006). High energy micron electron beam non-invasive diagnostics based on diffraction radiation. In RuPAC 2006 Contributions to the Proceedings - 20th Russian Conference on Charged Particle Accelerators (pp. 46-48)