Hardening of the surface layer of silumin by electron beam

Yurii Ivanov, Elizaveta Petrikova, Nikolai Nikolaevich Cherenda, Anton Teresov

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

In the present work we carried out the treatment of silumin by high-intensity electron beam with different density of the input energy. The structure and phase composition of surface layer have been studied by the methods of X-ray diffraction and electron microscopy both scanning and diffraction transmission. The mechanisms are responsible for improvement of properties of modified material have been revealed. It has been shown that electron beam treatment of silumin is accompanied by the formation of multilayer submicro-and nanocrystalline structure and result in increasing the microhardness of the surface layer (towards the core) is ~ 3.5 times, the Young's modulus in a ~ 1.4 times, the ultimate bending strength (in ~ 1.2 times) and tensile strength (in ~ 1.4 times), the bending plastic limit (in ~ 1.2 times) and tensile (in ~ 1.8 times).

Original languageEnglish
Title of host publicationAdvanced Materials Research
PublisherTrans Tech Publications Ltd
Pages162-166
Number of pages5
Volume872
ISBN (Print)9783037859667
DOIs
Publication statusPublished - 2014
EventRussian-German Forum on Nanotechnology - Tomsk, Russian Federation
Duration: 21 May 201324 May 2013

Publication series

NameAdvanced Materials Research
Volume872
ISSN (Print)10226680

Other

OtherRussian-German Forum on Nanotechnology
CountryRussian Federation
CityTomsk
Period21.5.1324.5.13

Keywords

  • Aluminum-based alloys
  • Cellular structure
  • Electron beam

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Ivanov, Y., Petrikova, E., Cherenda, N. N., & Teresov, A. (2014). Hardening of the surface layer of silumin by electron beam. In Advanced Materials Research (Vol. 872, pp. 162-166). (Advanced Materials Research; Vol. 872). Trans Tech Publications Ltd. https://doi.org/10.4028/www.scientific.net/AMR.872.162