The paper presents a transmission electron microscopy (TEM) study of the structural and phase state of commercially pure titanium implanted by aluminum ions. TEM study has been carried out for two types of grains, namely coarse (0.4μm) and small (0.5μm). This paper presents details of the yield stress calculations and the analysis of strength components for the both grain types in two areas of the modified layer: at a distance of 0-150nm (surface area I) and ∼300nm (central area II) from the irradiated surface. It is shown that the ion implantation results in a considerable hardening of the entire thickness of the implanted layer in the both grain types. The grain size has, however, a different effect on the yield stress in areas I and II. Thus, near the ion-alloyed layer, the yield stress decreases with the increase of the grain size, whilst area II demonstrates its increase. Moreover, the contribution to the general hardening of the alloy made by certain hardening mechanisms differs from contributions made by each of these mechanisms in each certain case.