Guest editorial: Non-Destructive testing

Ravibabu Mulaveesala, Vanita Arora, Geetika Dua, Vladimir P. Vavilov, Xingwang Guo, Paolo Bison, Nicolas P. Avdelidis

Research output: Contribution to journalEditorialpeer-review

Original languageEnglish
Pages (from-to)972-973
Number of pages2
JournalElectronics Letters
Volume56
Issue number19
DOIs
Publication statusPublished - 17 Sep 2020

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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