Grating scanner for measurement of micron-size beam profiles

L. G. Sukhikh, A. P. Potylitsyn, S. A. Strokov, G. Kube, K. Wittenburg

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Wire scanners are widely used for transverse beam size diagnostics. The minimum detectable beam size is affected by the diameter of a single wire that is of about 4 microns. Sub-micron beam sizes have to be resolved due to development of modern electron accelerators and future linear electron-positron colliders. In this report we propose to use a set of of gold stripes with varying period (gap) on a Si substrate. By moving this scanner across the beam one could measure the Bremsstrahlung yield vs. the coordinate, resulting in an oscillating dependence. The visibility of the resulting image allows defining the beam sizes in the range of 0.5-1.5 µm for the proposed scanner parameters.

Original languageEnglish
Title of host publicationProceedings of the 7th International Beam Instrumentation Conference, IBIC 2018
PublisherJoint Accelerator Conferences Website (JACoW)
ISBN (Electronic)9783954502011
DOIs
Publication statusPublished - Nov 2018
Event7th International Beam Instrumentation Conference, IBIC 2018 - Shanghai, China
Duration: 9 Sep 201813 Sep 2018

Publication series

NameProceedings of the 7th International Beam Instrumentation Conference, IBIC 2018

Conference

Conference7th International Beam Instrumentation Conference, IBIC 2018
CountryChina
CityShanghai
Period9.9.1813.9.18

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ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics

Cite this

Sukhikh, L. G., Potylitsyn, A. P., Strokov, S. A., Kube, G., & Wittenburg, K. (2018). Grating scanner for measurement of micron-size beam profiles. In Proceedings of the 7th International Beam Instrumentation Conference, IBIC 2018 (Proceedings of the 7th International Beam Instrumentation Conference, IBIC 2018). Joint Accelerator Conferences Website (JACoW). https://doi.org/10.18429/JACoW-IBIC2018-wepb10