Grating scanner for measurement of micron-size beam profiles

L. G. Sukhikh, A. P. Potylitsyn, S. A. Strokov, G. Kube, K. Wittenburg

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Wire scanners are widely used for transverse beam size diagnostics. The minimum detectable beam size is affected by the diameter of a single wire that is of about 4 microns. Sub-micron beam sizes have to be resolved due to development of modern electron accelerators and future linear electron-positron colliders. In this report we propose to use a set of of gold stripes with varying period (gap) on a Si substrate. By moving this scanner across the beam one could measure the Bremsstrahlung yield vs. the coordinate, resulting in an oscillating dependence. The visibility of the resulting image allows defining the beam sizes in the range of 0.5-1.5 µm for the proposed scanner parameters.

Original languageEnglish
Title of host publicationProceedings of the 7th International Beam Instrumentation Conference, IBIC 2018
PublisherJoint Accelerator Conferences Website (JACoW)
ISBN (Electronic)9783954502011
DOIs
Publication statusPublished - Nov 2018
Event7th International Beam Instrumentation Conference, IBIC 2018 - Shanghai, China
Duration: 9 Sep 201813 Sep 2018

Publication series

NameProceedings of the 7th International Beam Instrumentation Conference, IBIC 2018

Conference

Conference7th International Beam Instrumentation Conference, IBIC 2018
CountryChina
CityShanghai
Period9.9.1813.9.18

Fingerprint

scanners
Wire
gratings
Colliding beam accelerators
Positrons
profiles
Visibility
Particle accelerators
Gold
Electrons
wire
Substrates
electron accelerators
visibility
bremsstrahlung
positrons
gold
electrons

ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics

Cite this

Sukhikh, L. G., Potylitsyn, A. P., Strokov, S. A., Kube, G., & Wittenburg, K. (2018). Grating scanner for measurement of micron-size beam profiles. In Proceedings of the 7th International Beam Instrumentation Conference, IBIC 2018 (Proceedings of the 7th International Beam Instrumentation Conference, IBIC 2018). Joint Accelerator Conferences Website (JACoW). https://doi.org/10.18429/JACoW-IBIC2018-wepb10

Grating scanner for measurement of micron-size beam profiles. / Sukhikh, L. G.; Potylitsyn, A. P.; Strokov, S. A.; Kube, G.; Wittenburg, K.

Proceedings of the 7th International Beam Instrumentation Conference, IBIC 2018. Joint Accelerator Conferences Website (JACoW), 2018. (Proceedings of the 7th International Beam Instrumentation Conference, IBIC 2018).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Sukhikh, LG, Potylitsyn, AP, Strokov, SA, Kube, G & Wittenburg, K 2018, Grating scanner for measurement of micron-size beam profiles. in Proceedings of the 7th International Beam Instrumentation Conference, IBIC 2018. Proceedings of the 7th International Beam Instrumentation Conference, IBIC 2018, Joint Accelerator Conferences Website (JACoW), 7th International Beam Instrumentation Conference, IBIC 2018, Shanghai, China, 9.9.18. https://doi.org/10.18429/JACoW-IBIC2018-wepb10
Sukhikh LG, Potylitsyn AP, Strokov SA, Kube G, Wittenburg K. Grating scanner for measurement of micron-size beam profiles. In Proceedings of the 7th International Beam Instrumentation Conference, IBIC 2018. Joint Accelerator Conferences Website (JACoW). 2018. (Proceedings of the 7th International Beam Instrumentation Conference, IBIC 2018). https://doi.org/10.18429/JACoW-IBIC2018-wepb10
Sukhikh, L. G. ; Potylitsyn, A. P. ; Strokov, S. A. ; Kube, G. ; Wittenburg, K. / Grating scanner for measurement of micron-size beam profiles. Proceedings of the 7th International Beam Instrumentation Conference, IBIC 2018. Joint Accelerator Conferences Website (JACoW), 2018. (Proceedings of the 7th International Beam Instrumentation Conference, IBIC 2018).
@inproceedings{a66191b833f7453aad6d265523dc0f1e,
title = "Grating scanner for measurement of micron-size beam profiles",
abstract = "Wire scanners are widely used for transverse beam size diagnostics. The minimum detectable beam size is affected by the diameter of a single wire that is of about 4 microns. Sub-micron beam sizes have to be resolved due to development of modern electron accelerators and future linear electron-positron colliders. In this report we propose to use a set of of gold stripes with varying period (gap) on a Si substrate. By moving this scanner across the beam one could measure the Bremsstrahlung yield vs. the coordinate, resulting in an oscillating dependence. The visibility of the resulting image allows defining the beam sizes in the range of 0.5-1.5 µm for the proposed scanner parameters.",
author = "Sukhikh, {L. G.} and Potylitsyn, {A. P.} and Strokov, {S. A.} and G. Kube and K. Wittenburg",
year = "2018",
month = "11",
doi = "10.18429/JACoW-IBIC2018-wepb10",
language = "English",
series = "Proceedings of the 7th International Beam Instrumentation Conference, IBIC 2018",
publisher = "Joint Accelerator Conferences Website (JACoW)",
booktitle = "Proceedings of the 7th International Beam Instrumentation Conference, IBIC 2018",

}

TY - GEN

T1 - Grating scanner for measurement of micron-size beam profiles

AU - Sukhikh, L. G.

AU - Potylitsyn, A. P.

AU - Strokov, S. A.

AU - Kube, G.

AU - Wittenburg, K.

PY - 2018/11

Y1 - 2018/11

N2 - Wire scanners are widely used for transverse beam size diagnostics. The minimum detectable beam size is affected by the diameter of a single wire that is of about 4 microns. Sub-micron beam sizes have to be resolved due to development of modern electron accelerators and future linear electron-positron colliders. In this report we propose to use a set of of gold stripes with varying period (gap) on a Si substrate. By moving this scanner across the beam one could measure the Bremsstrahlung yield vs. the coordinate, resulting in an oscillating dependence. The visibility of the resulting image allows defining the beam sizes in the range of 0.5-1.5 µm for the proposed scanner parameters.

AB - Wire scanners are widely used for transverse beam size diagnostics. The minimum detectable beam size is affected by the diameter of a single wire that is of about 4 microns. Sub-micron beam sizes have to be resolved due to development of modern electron accelerators and future linear electron-positron colliders. In this report we propose to use a set of of gold stripes with varying period (gap) on a Si substrate. By moving this scanner across the beam one could measure the Bremsstrahlung yield vs. the coordinate, resulting in an oscillating dependence. The visibility of the resulting image allows defining the beam sizes in the range of 0.5-1.5 µm for the proposed scanner parameters.

UR - http://www.scopus.com/inward/record.url?scp=85071969067&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85071969067&partnerID=8YFLogxK

U2 - 10.18429/JACoW-IBIC2018-wepb10

DO - 10.18429/JACoW-IBIC2018-wepb10

M3 - Conference contribution

AN - SCOPUS:85071969067

T3 - Proceedings of the 7th International Beam Instrumentation Conference, IBIC 2018

BT - Proceedings of the 7th International Beam Instrumentation Conference, IBIC 2018

PB - Joint Accelerator Conferences Website (JACoW)

ER -