Generation of X-ray beams by photons and relativistic electrons on crystals under the Bragg condition

Y. N. Adischev, S. I. Arischev, I. E. Vnukov, A. V. Vukolov, V. N. Zabaev, B. N. Kalinin, V. V. Kaplin, Yu P. Kunashenko, N. N. Nasonov, A. P. Potylytsyn, S. R. Uglov, U. S. Salikhbaev, A. N. Safarov, V. Skripnik, I. Khakberdiev, A. D. Yusupov

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The parametric x-ray (PXR) photon yield from single-crystal tungsten was studied in the Bragg geometry in an experiment on the SIRIUS synchrotron in Tomsk using an e-beam with the energy E=500 MeV. The tungsten crystal thickness was 1.7 mm and the surface mosaicity - not more than 1.5'. The crystal was aligned as [111] with the Bragg angle θB=45° to the e-beam direction. The photons were detected at 2θB=90° with respect to the e-beam. The angular PXR distributions were compared with the calculations including the real experimental conditions. The experimental setup for measurement diffraction of bremstrahlung of electrons in the silicon crystal is described. The arrangement is based on the microtrone MT-22, with electron beam energy 13 MeV and 22 MeV.

Original languageEnglish
Title of host publication5th Korea-Russia International Symposium on Science and Technology - Proceedings
Subtitle of host publicationKORUS 2001
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages284-287
Number of pages4
Volume1
ISBN (Electronic)0780370082, 9780780370081
DOIs
Publication statusPublished - 1 Jan 2001
Event5th Korea-Russia International Symposium on Science and Technology, KORUS 2001 - Tomsk, Russian Federation
Duration: 26 Jun 20013 Jul 2001

Conference

Conference5th Korea-Russia International Symposium on Science and Technology, KORUS 2001
CountryRussian Federation
CityTomsk
Period26.6.013.7.01

Fingerprint

Tungsten
Photons
X-Rays
Electrons
X rays
Crystals
Synchrotrons
Silicon
Electron beams
Diffraction
Single crystals
Geometry
Experiments
Direction compound

Keywords

  • monocrystall
  • parametric X-rays
  • spectral angular distributions

ASJC Scopus subject areas

  • Clinical Biochemistry
  • Computer Networks and Communications
  • Biotechnology
  • Civil and Structural Engineering
  • Mechanics of Materials
  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Surfaces, Coatings and Films

Cite this

Adischev, Y. N., Arischev, S. I., Vnukov, I. E., Vukolov, A. V., Zabaev, V. N., Kalinin, B. N., ... Yusupov, A. D. (2001). Generation of X-ray beams by photons and relativistic electrons on crystals under the Bragg condition. In 5th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2001 (Vol. 1, pp. 284-287). [975125] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/KORUS.2001.975125

Generation of X-ray beams by photons and relativistic electrons on crystals under the Bragg condition. / Adischev, Y. N.; Arischev, S. I.; Vnukov, I. E.; Vukolov, A. V.; Zabaev, V. N.; Kalinin, B. N.; Kaplin, V. V.; Kunashenko, Yu P.; Nasonov, N. N.; Potylytsyn, A. P.; Uglov, S. R.; Salikhbaev, U. S.; Safarov, A. N.; Skripnik, V.; Khakberdiev, I.; Yusupov, A. D.

5th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2001. Vol. 1 Institute of Electrical and Electronics Engineers Inc., 2001. p. 284-287 975125.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Adischev, YN, Arischev, SI, Vnukov, IE, Vukolov, AV, Zabaev, VN, Kalinin, BN, Kaplin, VV, Kunashenko, YP, Nasonov, NN, Potylytsyn, AP, Uglov, SR, Salikhbaev, US, Safarov, AN, Skripnik, V, Khakberdiev, I & Yusupov, AD 2001, Generation of X-ray beams by photons and relativistic electrons on crystals under the Bragg condition. in 5th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2001. vol. 1, 975125, Institute of Electrical and Electronics Engineers Inc., pp. 284-287, 5th Korea-Russia International Symposium on Science and Technology, KORUS 2001, Tomsk, Russian Federation, 26.6.01. https://doi.org/10.1109/KORUS.2001.975125
Adischev YN, Arischev SI, Vnukov IE, Vukolov AV, Zabaev VN, Kalinin BN et al. Generation of X-ray beams by photons and relativistic electrons on crystals under the Bragg condition. In 5th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2001. Vol. 1. Institute of Electrical and Electronics Engineers Inc. 2001. p. 284-287. 975125 https://doi.org/10.1109/KORUS.2001.975125
Adischev, Y. N. ; Arischev, S. I. ; Vnukov, I. E. ; Vukolov, A. V. ; Zabaev, V. N. ; Kalinin, B. N. ; Kaplin, V. V. ; Kunashenko, Yu P. ; Nasonov, N. N. ; Potylytsyn, A. P. ; Uglov, S. R. ; Salikhbaev, U. S. ; Safarov, A. N. ; Skripnik, V. ; Khakberdiev, I. ; Yusupov, A. D. / Generation of X-ray beams by photons and relativistic electrons on crystals under the Bragg condition. 5th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2001. Vol. 1 Institute of Electrical and Electronics Engineers Inc., 2001. pp. 284-287
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AU - Salikhbaev, U. S.

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N2 - The parametric x-ray (PXR) photon yield from single-crystal tungsten was studied in the Bragg geometry in an experiment on the SIRIUS synchrotron in Tomsk using an e-beam with the energy E=500 MeV. The tungsten crystal thickness was 1.7 mm and the surface mosaicity - not more than 1.5'. The crystal was aligned as [111] with the Bragg angle θB=45° to the e-beam direction. The photons were detected at 2θB=90° with respect to the e-beam. The angular PXR distributions were compared with the calculations including the real experimental conditions. The experimental setup for measurement diffraction of bremstrahlung of electrons in the silicon crystal is described. The arrangement is based on the microtrone MT-22, with electron beam energy 13 MeV and 22 MeV.

AB - The parametric x-ray (PXR) photon yield from single-crystal tungsten was studied in the Bragg geometry in an experiment on the SIRIUS synchrotron in Tomsk using an e-beam with the energy E=500 MeV. The tungsten crystal thickness was 1.7 mm and the surface mosaicity - not more than 1.5'. The crystal was aligned as [111] with the Bragg angle θB=45° to the e-beam direction. The photons were detected at 2θB=90° with respect to the e-beam. The angular PXR distributions were compared with the calculations including the real experimental conditions. The experimental setup for measurement diffraction of bremstrahlung of electrons in the silicon crystal is described. The arrangement is based on the microtrone MT-22, with electron beam energy 13 MeV and 22 MeV.

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KW - spectral angular distributions

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