Abstract
A sensitivity comparison is presented for the following styles of spectrometric electronic flaw detector: single-channel, two-channel single-beam, and two-beam. The effects of electron-energy discrimination level at the detectors are studied.
Original language | English |
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Title of host publication | Sov J Nondestr Test |
Pages | 710-713 |
Number of pages | 4 |
Volume | 11 |
Edition | 6 |
Publication status | Published - Nov 1975 |
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ASJC Scopus subject areas
- Engineering(all)
Cite this
FUNCTIONAL SCHEMES FOR ELECTRONIC SPECTROMETRIC FLAW DETECTORS. / Lisin, V. A.
Sov J Nondestr Test. Vol. 11 6. ed. 1975. p. 710-713.Research output: Chapter in Book/Report/Conference proceeding › Chapter
}
TY - CHAP
T1 - FUNCTIONAL SCHEMES FOR ELECTRONIC SPECTROMETRIC FLAW DETECTORS.
AU - Lisin, V. A.
PY - 1975/11
Y1 - 1975/11
N2 - A sensitivity comparison is presented for the following styles of spectrometric electronic flaw detector: single-channel, two-channel single-beam, and two-beam. The effects of electron-energy discrimination level at the detectors are studied.
AB - A sensitivity comparison is presented for the following styles of spectrometric electronic flaw detector: single-channel, two-channel single-beam, and two-beam. The effects of electron-energy discrimination level at the detectors are studied.
UR - http://www.scopus.com/inward/record.url?scp=0016579509&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0016579509&partnerID=8YFLogxK
M3 - Chapter
AN - SCOPUS:0016579509
VL - 11
SP - 710
EP - 713
BT - Sov J Nondestr Test
ER -