FUNCTIONAL SCHEMES FOR ELECTRONIC SPECTROMETRIC FLAW DETECTORS.

V. A. Lisin

    Research output: Chapter in Book/Report/Conference proceedingChapter

    Abstract

    A sensitivity comparison is presented for the following styles of spectrometric electronic flaw detector: single-channel, two-channel single-beam, and two-beam. The effects of electron-energy discrimination level at the detectors are studied.

    Original languageEnglish
    Title of host publicationSov J Nondestr Test
    Pages710-713
    Number of pages4
    Volume11
    Edition6
    Publication statusPublished - Nov 1975

    ASJC Scopus subject areas

    • Engineering(all)

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  • Cite this

    Lisin, V. A. (1975). FUNCTIONAL SCHEMES FOR ELECTRONIC SPECTROMETRIC FLAW DETECTORS. In Sov J Nondestr Test (6 ed., Vol. 11, pp. 710-713)