FUNCTIONAL SCHEMES FOR ELECTRONIC SPECTROMETRIC FLAW DETECTORS.

V. A. Lisin

    Research output: Chapter in Book/Report/Conference proceeding › Chapter

    Abstract

    A sensitivity comparison is presented for the following styles of spectrometric electronic flaw detector: single-channel, two-channel single-beam, and two-beam. The effects of electron-energy discrimination level at the detectors are studied.

    Original languageEnglish
    Title of host publicationSov J Nondestr Test
    Pages710-713
    Number of pages4
    Volume11
    Edition6
    Publication statusPublished - Nov 1975

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    Detectors
    Defects
    Electron energy levels

    ASJC Scopus subject areas

    • Engineering(all)

    Cite this

    Lisin, V. A. (1975). FUNCTIONAL SCHEMES FOR ELECTRONIC SPECTROMETRIC FLAW DETECTORS. In Sov J Nondestr Test (6 ed., Vol. 11, pp. 710-713)

    FUNCTIONAL SCHEMES FOR ELECTRONIC SPECTROMETRIC FLAW DETECTORS. / Lisin, V. A.

    Sov J Nondestr Test. Vol. 11 6. ed. 1975. p. 710-713.

    Research output: Chapter in Book/Report/Conference proceeding › Chapter

    Lisin, VA 1975, FUNCTIONAL SCHEMES FOR ELECTRONIC SPECTROMETRIC FLAW DETECTORS. in Sov J Nondestr Test. 6 edn, vol. 11, pp. 710-713.
    Lisin VA. FUNCTIONAL SCHEMES FOR ELECTRONIC SPECTROMETRIC FLAW DETECTORS. In Sov J Nondestr Test. 6 ed. Vol. 11. 1975. p. 710-713
    Lisin, V. A. / FUNCTIONAL SCHEMES FOR ELECTRONIC SPECTROMETRIC FLAW DETECTORS. Sov J Nondestr Test. Vol. 11 6. ed. 1975. pp. 710-713
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