Frequency spectrum of dielectric strength of PET

O. S. Gefle, S. M. Lebedev, Y. P. Pokholkov, E. Gockenbach, H. Borsi, C. D. Ritschel, L. Hoppe

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

It is a well-known fact that the breakdown voltage of a dielectric at the same thickness depends on a rate of increase of the applied voltage. At some rate of increase of voltage a minimum of either the voltage-time characteristic or the dielectric strength are usually observed. This effect is very important from the practice for the choice of the optimal frequency range of dielectrics being used in HV designs. In this work the testing results of the voltage-time characteristic study for PET film are represented. PET is usually used as HV insulation of various electrical engineering equipment. The role of the frequency dispersion of the complex permittivity in the appearance of minimum in the voltage-time characteristic or the dielectric strength of PET films was discussed.

Original languageEnglish
Title of host publicationProceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004
Pages64-66
Number of pages3
Volume1
Publication statusPublished - 2004
EventProceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004 - Toulouse, France
Duration: 5 Jul 20049 Jul 2004

Other

OtherProceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004
CountryFrance
CityToulouse
Period5.7.049.7.04

Fingerprint

Electric potential
Electrical engineering
Electric breakdown
Insulation
Permittivity
Testing

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Gefle, O. S., Lebedev, S. M., Pokholkov, Y. P., Gockenbach, E., Borsi, H., Ritschel, C. D., & Hoppe, L. (2004). Frequency spectrum of dielectric strength of PET. In Proceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004 (Vol. 1, pp. 64-66)

Frequency spectrum of dielectric strength of PET. / Gefle, O. S.; Lebedev, S. M.; Pokholkov, Y. P.; Gockenbach, E.; Borsi, H.; Ritschel, C. D.; Hoppe, L.

Proceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004. Vol. 1 2004. p. 64-66.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Gefle, OS, Lebedev, SM, Pokholkov, YP, Gockenbach, E, Borsi, H, Ritschel, CD & Hoppe, L 2004, Frequency spectrum of dielectric strength of PET. in Proceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004. vol. 1, pp. 64-66, Proceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004, Toulouse, France, 5.7.04.
Gefle OS, Lebedev SM, Pokholkov YP, Gockenbach E, Borsi H, Ritschel CD et al. Frequency spectrum of dielectric strength of PET. In Proceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004. Vol. 1. 2004. p. 64-66
Gefle, O. S. ; Lebedev, S. M. ; Pokholkov, Y. P. ; Gockenbach, E. ; Borsi, H. ; Ritschel, C. D. ; Hoppe, L. / Frequency spectrum of dielectric strength of PET. Proceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004. Vol. 1 2004. pp. 64-66
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