Forward diffracted parametric X radiation from a thick tungsten single crystal at 855 MeV electron energy

H. Backe, W. Lauth, A. F. Scharafutdinov, P. Kunz, A. S. Gogolev, A. P. Potylitsyn

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Features of forward diffracted Parametric X-Radiation (PXR) were investigated at experiments with the 855 MeV electron beam of the Mainz Microtron MAMI employing a 410 μm thick tungsten single crystal. Virtual photons from the electron field are diffracted by the (101̄) plane at a Bragg angle of 3.977°. Forward emitted radiation was analyzed at an energy of 40 keV with the (111) lattice planes of a flat silicon single crystal in Bragg geometry. Clear peak structures were observed in an angular scan of the tungsten single crystal. The results were analyzed with a model which describes forward diffracted PXR under real experimental conditions. The experiments show that forward diffracted PXR may be employed to diagnose bending radii of lattice planes in large area single crystals.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume6634
DOIs
Publication statusPublished - 2007
EventInternational Conference on Charged and Neutral Particles Channeling: Phenomena II - Rome, Italy
Duration: 3 Jul 20067 Jul 2006

Other

OtherInternational Conference on Charged and Neutral Particles Channeling: Phenomena II
CountryItaly
CityRome
Period3.7.067.7.06

Fingerprint

Tungsten
tungsten
Single crystals
electron energy
Radiation
Electrons
single crystals
radiation
Crystal lattices
Bragg angle
Electron beams
Photons
Experiments
electron beams
Silicon
radii
Geometry
photons
silicon
geometry

Keywords

  • Parametric X radiation

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Backe, H., Lauth, W., Scharafutdinov, A. F., Kunz, P., Gogolev, A. S., & Potylitsyn, A. P. (2007). Forward diffracted parametric X radiation from a thick tungsten single crystal at 855 MeV electron energy. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 6634). [66340Z] https://doi.org/10.1117/12.741924

Forward diffracted parametric X radiation from a thick tungsten single crystal at 855 MeV electron energy. / Backe, H.; Lauth, W.; Scharafutdinov, A. F.; Kunz, P.; Gogolev, A. S.; Potylitsyn, A. P.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6634 2007. 66340Z.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Backe, H, Lauth, W, Scharafutdinov, AF, Kunz, P, Gogolev, AS & Potylitsyn, AP 2007, Forward diffracted parametric X radiation from a thick tungsten single crystal at 855 MeV electron energy. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 6634, 66340Z, International Conference on Charged and Neutral Particles Channeling: Phenomena II, Rome, Italy, 3.7.06. https://doi.org/10.1117/12.741924
Backe H, Lauth W, Scharafutdinov AF, Kunz P, Gogolev AS, Potylitsyn AP. Forward diffracted parametric X radiation from a thick tungsten single crystal at 855 MeV electron energy. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6634. 2007. 66340Z https://doi.org/10.1117/12.741924
Backe, H. ; Lauth, W. ; Scharafutdinov, A. F. ; Kunz, P. ; Gogolev, A. S. ; Potylitsyn, A. P. / Forward diffracted parametric X radiation from a thick tungsten single crystal at 855 MeV electron energy. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6634 2007.
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