Forward diffracted parametric X radiation from a thick tungsten single crystal at 855 MeV electron energy

Abstract

Features of forward diffracted Parametric X-Radiation (PXR) were investigated at experiments with the 855 MeV electron beam of the Mainz Microtron MAMI employing a 410 μm thick tungsten single crystal. Virtual photons from the electron field are diffracted by the (101̄) plane at a Bragg angle of 3.977°. Forward emitted radiation was analyzed at an energy of 40 keV with the (111) lattice planes of a flat silicon single crystal in Bragg geometry. Clear peak structures were observed in an angular scan of the tungsten single crystal. The results were analyzed with a model which describes forward diffracted PXR under real experimental conditions. The experiments show that forward diffracted PXR may be employed to diagnose bending radii of lattice planes in large area single crystals.

Original language	English
Title of host publication	Proceedings of SPIE - The International Society for Optical Engineering
Volume	6634
DOIs	https://doi.org/10.1117/12.741924
Publication status	Published - 2007
Event	International Conference on Charged and Neutral Particles Channeling: Phenomena II - Rome, Italy Duration: 3 Jul 2006 → 7 Jul 2006

Other

Other	International Conference on Charged and Neutral Particles Channeling: Phenomena II
Country	Italy
City	Rome
Period	3.7.06 → 7.7.06

Keywords

Parametric X radiation

ASJC Scopus subject areas

Electrical and Electronic Engineering
Condensed Matter Physics

Access to Document

10.1117/12.741924

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Forward diffracted parametric X radiation from a thick tungsten single crystal at 855 MeV electron energy. / Backe, H.; Lauth, W.; Scharafutdinov, A. F.; Kunz, P.; Gogolev, A. S.; Potylitsyn, A. P.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 6634 2007. 66340Z.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Backe, H, Lauth, W, Scharafutdinov, AF, Kunz, P, Gogolev, AS & Potylitsyn, AP 2007, Forward diffracted parametric X radiation from a thick tungsten single crystal at 855 MeV electron energy. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 6634, 66340Z, International Conference on Charged and Neutral Particles Channeling: Phenomena II, Rome, Italy, 3.7.06. https://doi.org/10.1117/12.741924

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abstract = "Features of forward diffracted Parametric X-Radiation (PXR) were investigated at experiments with the 855 MeV electron beam of the Mainz Microtron MAMI employing a 410 μm thick tungsten single crystal. Virtual photons from the electron field are diffracted by the (10{\=1}) plane at a Bragg angle of 3.977°. Forward emitted radiation was analyzed at an energy of 40 keV with the (111) lattice planes of a flat silicon single crystal in Bragg geometry. Clear peak structures were observed in an angular scan of the tungsten single crystal. The results were analyzed with a model which describes forward diffracted PXR under real experimental conditions. The experiments show that forward diffracted PXR may be employed to diagnose bending radii of lattice planes in large area single crystals.",

keywords = "Parametric X radiation",

author = "H. Backe and W. Lauth and Scharafutdinov, {A. F.} and P. Kunz and Gogolev, {A. S.} and Potylitsyn, {A. P.}",

year = "2007",

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AU - Gogolev, A. S.

AU - Potylitsyn, A. P.

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AB - Features of forward diffracted Parametric X-Radiation (PXR) were investigated at experiments with the 855 MeV electron beam of the Mainz Microtron MAMI employing a 410 μm thick tungsten single crystal. Virtual photons from the electron field are diffracted by the (101̄) plane at a Bragg angle of 3.977°. Forward emitted radiation was analyzed at an energy of 40 keV with the (111) lattice planes of a flat silicon single crystal in Bragg geometry. Clear peak structures were observed in an angular scan of the tungsten single crystal. The results were analyzed with a model which describes forward diffracted PXR under real experimental conditions. The experiments show that forward diffracted PXR may be employed to diagnose bending radii of lattice planes in large area single crystals.

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