Forming the defect structure in copper after exposure with high power microwave pulses

A. N. Didenko, E. V. Kozlov, Yu P. Sharkeev, A. S. Sulakshin, N. M. Filipenko, N. V. Girsova, S. V. Fortuna, Yu V. Medvedev

Research output: Contribution to journalArticle

Abstract

Using the transmission electron microscopy the defect structures forming in near surface layers of polycrystal copper under the high power pulsed microwave influence have been investigated. Forming the stable dislocation structure in near surface layer of irradiated specimens was confirmed. Decrease of the surface layer specific resistance was established. Possible physical causes of the dislocations generation under pulsed microwave influence have been discussed.

Original languageEnglish
Pages (from-to)21-26
Number of pages6
JournalFizika i Khimiya Obrabotki Materialov
Issue number5
Publication statusPublished - Sep 1997

Fingerprint

Defect structures
Copper
Microwaves
Polycrystals
Transmission electron microscopy

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Didenko, A. N., Kozlov, E. V., Sharkeev, Y. P., Sulakshin, A. S., Filipenko, N. M., Girsova, N. V., ... Medvedev, Y. V. (1997). Forming the defect structure in copper after exposure with high power microwave pulses. Fizika i Khimiya Obrabotki Materialov, (5), 21-26.

Forming the defect structure in copper after exposure with high power microwave pulses. / Didenko, A. N.; Kozlov, E. V.; Sharkeev, Yu P.; Sulakshin, A. S.; Filipenko, N. M.; Girsova, N. V.; Fortuna, S. V.; Medvedev, Yu V.

In: Fizika i Khimiya Obrabotki Materialov, No. 5, 09.1997, p. 21-26.

Research output: Contribution to journalArticle

Didenko, AN, Kozlov, EV, Sharkeev, YP, Sulakshin, AS, Filipenko, NM, Girsova, NV, Fortuna, SV & Medvedev, YV 1997, 'Forming the defect structure in copper after exposure with high power microwave pulses', Fizika i Khimiya Obrabotki Materialov, no. 5, pp. 21-26.
Didenko AN, Kozlov EV, Sharkeev YP, Sulakshin AS, Filipenko NM, Girsova NV et al. Forming the defect structure in copper after exposure with high power microwave pulses. Fizika i Khimiya Obrabotki Materialov. 1997 Sep;(5):21-26.
Didenko, A. N. ; Kozlov, E. V. ; Sharkeev, Yu P. ; Sulakshin, A. S. ; Filipenko, N. M. ; Girsova, N. V. ; Fortuna, S. V. ; Medvedev, Yu V. / Forming the defect structure in copper after exposure with high power microwave pulses. In: Fizika i Khimiya Obrabotki Materialov. 1997 ; No. 5. pp. 21-26.
@article{e9f380b298b344c389e0b56122e55bff,
title = "Forming the defect structure in copper after exposure with high power microwave pulses",
abstract = "Using the transmission electron microscopy the defect structures forming in near surface layers of polycrystal copper under the high power pulsed microwave influence have been investigated. Forming the stable dislocation structure in near surface layer of irradiated specimens was confirmed. Decrease of the surface layer specific resistance was established. Possible physical causes of the dislocations generation under pulsed microwave influence have been discussed.",
author = "Didenko, {A. N.} and Kozlov, {E. V.} and Sharkeev, {Yu P.} and Sulakshin, {A. S.} and Filipenko, {N. M.} and Girsova, {N. V.} and Fortuna, {S. V.} and Medvedev, {Yu V.}",
year = "1997",
month = "9",
language = "English",
pages = "21--26",
journal = "Fizika i Khimiya Obrabotki Materialov",
issn = "0015-3214",
publisher = "Izdatel'stvo Nauka",
number = "5",

}

TY - JOUR

T1 - Forming the defect structure in copper after exposure with high power microwave pulses

AU - Didenko, A. N.

AU - Kozlov, E. V.

AU - Sharkeev, Yu P.

AU - Sulakshin, A. S.

AU - Filipenko, N. M.

AU - Girsova, N. V.

AU - Fortuna, S. V.

AU - Medvedev, Yu V.

PY - 1997/9

Y1 - 1997/9

N2 - Using the transmission electron microscopy the defect structures forming in near surface layers of polycrystal copper under the high power pulsed microwave influence have been investigated. Forming the stable dislocation structure in near surface layer of irradiated specimens was confirmed. Decrease of the surface layer specific resistance was established. Possible physical causes of the dislocations generation under pulsed microwave influence have been discussed.

AB - Using the transmission electron microscopy the defect structures forming in near surface layers of polycrystal copper under the high power pulsed microwave influence have been investigated. Forming the stable dislocation structure in near surface layer of irradiated specimens was confirmed. Decrease of the surface layer specific resistance was established. Possible physical causes of the dislocations generation under pulsed microwave influence have been discussed.

UR - http://www.scopus.com/inward/record.url?scp=0031223943&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0031223943&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0031223943

SP - 21

EP - 26

JO - Fizika i Khimiya Obrabotki Materialov

JF - Fizika i Khimiya Obrabotki Materialov

SN - 0015-3214

IS - 5

ER -