Forming the defect structure in copper after exposure with high power microwave pulses

A. N. Didenko, E. V. Kozlov, Yu P. Sharkeev, A. S. Sulakshin, N. M. Filipenko, N. V. Girsova, S. V. Fortuna, Yu V. Medvedev

Research School of High-Energy Physics

Research output: Contribution to journal › Article › peer-review

Abstract

Using the transmission electron microscopy the defect structures forming in near surface layers of polycrystal copper under the high power pulsed microwave influence have been investigated. Forming the stable dislocation structure in near surface layer of irradiated specimens was confirmed. Decrease of the surface layer specific resistance was established. Possible physical causes of the dislocations generation under pulsed microwave influence have been discussed.

Original language	English
Pages (from-to)	21-26
Number of pages	6
Journal	Fizika i Khimiya Obrabotki Materialov
Issue number	5
Publication status	Published - Sep 1997

ASJC Scopus subject areas

Materials Science(all)

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title = "Forming the defect structure in copper after exposure with high power microwave pulses",

abstract = "Using the transmission electron microscopy the defect structures forming in near surface layers of polycrystal copper under the high power pulsed microwave influence have been investigated. Forming the stable dislocation structure in near surface layer of irradiated specimens was confirmed. Decrease of the surface layer specific resistance was established. Possible physical causes of the dislocations generation under pulsed microwave influence have been discussed.",

author = "Didenko, {A. N.} and Kozlov, {E. V.} and Sharkeev, {Yu P.} and Sulakshin, {A. S.} and Filipenko, {N. M.} and Girsova, {N. V.} and Fortuna, {S. V.} and Medvedev, {Yu V.}",

year = "1997",

month = sep,

language = "English",

pages = "21--26",

journal = "Fizika i Khimiya Obrabotki Materialov",

issn = "0015-3214",

publisher = "Izdatel'stvo Nauka",

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T1 - Forming the defect structure in copper after exposure with high power microwave pulses

AU - Didenko, A. N.

AU - Kozlov, E. V.

AU - Sharkeev, Yu P.

AU - Sulakshin, A. S.

AU - Filipenko, N. M.

AU - Girsova, N. V.

AU - Fortuna, S. V.

AU - Medvedev, Yu V.

PY - 1997/9

Y1 - 1997/9

N2 - Using the transmission electron microscopy the defect structures forming in near surface layers of polycrystal copper under the high power pulsed microwave influence have been investigated. Forming the stable dislocation structure in near surface layer of irradiated specimens was confirmed. Decrease of the surface layer specific resistance was established. Possible physical causes of the dislocations generation under pulsed microwave influence have been discussed.

AB - Using the transmission electron microscopy the defect structures forming in near surface layers of polycrystal copper under the high power pulsed microwave influence have been investigated. Forming the stable dislocation structure in near surface layer of irradiated specimens was confirmed. Decrease of the surface layer specific resistance was established. Possible physical causes of the dislocations generation under pulsed microwave influence have been discussed.

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M3 - Article

AN - SCOPUS:0031223943

SP - 21

EP - 26

JO - Fizika i Khimiya Obrabotki Materialov

JF - Fizika i Khimiya Obrabotki Materialov

SN - 0015-3214

IS - 5

ER -

Forming the defect structure in copper after exposure with high power microwave pulses

Abstract

ASJC Scopus subject areas

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