Formation of concentration profiles of implanted ions in metallic materials under polyenergetic implantation

Abstract

A physical and mathematical model of mass transfer in polycrystalline metallic materials under exposure to ion beams is proposed. Alongside bulk indiffusion from the irradiated surface, diffusion along the migrating extensive defects interacting with an impurity is considered. For a polyenergetic ion beam, the contribution of bulk indiffusion is presented as an integral over energy of the product of two functions; one of them describes the energy distribution of ions in a beam and the second represents the implantation profile of monoenergetic ion beam.

Original language	English
Pages (from-to)	301-304
Number of pages	4
Journal	Journal of Surface Investigation
Volume	2
Issue number	2
DOIs	https://doi.org/10.1134/S1027451008020262
Publication status	Published - 1 Apr 2008

ASJC Scopus subject areas

Surfaces, Coatings and Films

Access to Document

10.1134/S1027451008020262

Fingerprint Dive into the research topics of 'Formation of concentration profiles of implanted ions in metallic materials under polyenergetic implantation'. Together they form a unique fingerprint.

Cite this

@article{6e24fd73ef864687b68945db72049f47,

title = "Formation of concentration profiles of implanted ions in metallic materials under polyenergetic implantation",

abstract = "A physical and mathematical model of mass transfer in polycrystalline metallic materials under exposure to ion beams is proposed. Alongside bulk indiffusion from the irradiated surface, diffusion along the migrating extensive defects interacting with an impurity is considered. For a polyenergetic ion beam, the contribution of bulk indiffusion is presented as an integral over energy of the product of two functions; one of them describes the energy distribution of ions in a beam and the second represents the implantation profile of monoenergetic ion beam.",

author = "Vakhnii, {T. V.} and Vershinin, {G. A.} and Bozhko, {I. A.} and Kurzina, {I. A.} and Sharkeev, {Yu P.} and Grekova, {T. S.}",

year = "2008",

month = apr,

day = "1",

doi = "10.1134/S1027451008020262",

language = "English",

volume = "2",

pages = "301--304",

journal = "Journal of Surface Investigation",

issn = "1027-4510",

publisher = "Maik Nauka-Interperiodica Publishing",

number = "2",

}

TY - JOUR

T1 - Formation of concentration profiles of implanted ions in metallic materials under polyenergetic implantation

AU - Vakhnii, T. V.

AU - Vershinin, G. A.

AU - Bozhko, I. A.

AU - Kurzina, I. A.

AU - Sharkeev, Yu P.

AU - Grekova, T. S.

PY - 2008/4/1

Y1 - 2008/4/1

N2 - A physical and mathematical model of mass transfer in polycrystalline metallic materials under exposure to ion beams is proposed. Alongside bulk indiffusion from the irradiated surface, diffusion along the migrating extensive defects interacting with an impurity is considered. For a polyenergetic ion beam, the contribution of bulk indiffusion is presented as an integral over energy of the product of two functions; one of them describes the energy distribution of ions in a beam and the second represents the implantation profile of monoenergetic ion beam.

AB - A physical and mathematical model of mass transfer in polycrystalline metallic materials under exposure to ion beams is proposed. Alongside bulk indiffusion from the irradiated surface, diffusion along the migrating extensive defects interacting with an impurity is considered. For a polyenergetic ion beam, the contribution of bulk indiffusion is presented as an integral over energy of the product of two functions; one of them describes the energy distribution of ions in a beam and the second represents the implantation profile of monoenergetic ion beam.

UR - http://www.scopus.com/inward/record.url?scp=58449116648&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=58449116648&partnerID=8YFLogxK

U2 - 10.1134/S1027451008020262

DO - 10.1134/S1027451008020262

M3 - Article

AN - SCOPUS:58449116648

VL - 2

SP - 301

EP - 304

JO - Journal of Surface Investigation

JF - Journal of Surface Investigation

SN - 1027-4510

IS - 2

ER -