Abstract
The results of investigating the focusing of a high-power ion beam, which is formed by a diode with a semicylindrical geometry and a passive anode, are presented. Two types of focusing diodes were investigated: with external magnetic insulation (one-pulse mode) and self-magnetic insulation of electrons (twopulse mode). Measurements of the energy-density distribution of the ion beam and the ion-current density were performed. It was found that when the diode operates in the two-pulse mode, the region of the maximum ion-beam energy density in the focal plane is displaced relative to the region of the maximum ion-current density by 5–10 mm. It is shown that the effect of a displacement of the focal spot with the maximum energy density is determined by the presence of a large number of accelerated neutral atoms in the ion beam. These atoms are produced as a result of the ion charge-exchange process in the anode–cathode gap of the ion diode during its operation in the two-pulse mode.
| Original language | English |
|---|---|
| Pages (from-to) | 562-569 |
| Number of pages | 8 |
| Journal | Instruments and Experimental Techniques |
| Volume | 60 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 1 Jul 2017 |
Fingerprint
ASJC Scopus subject areas
- Instrumentation
Cite this
Features of focusing of a high-intensity pulsed ion beam formed by a diode with a passive anode. / Zhu, X. P.; Ding, L.; Zhang, Q.; Pushkarev, A. I.; Lei, M. K.
In: Instruments and Experimental Techniques, Vol. 60, No. 4, 01.07.2017, p. 562-569.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Features of focusing of a high-intensity pulsed ion beam formed by a diode with a passive anode
AU - Zhu, X. P.
AU - Ding, L.
AU - Zhang, Q.
AU - Pushkarev, A. I.
AU - Lei, M. K.
PY - 2017/7/1
Y1 - 2017/7/1
N2 - The results of investigating the focusing of a high-power ion beam, which is formed by a diode with a semicylindrical geometry and a passive anode, are presented. Two types of focusing diodes were investigated: with external magnetic insulation (one-pulse mode) and self-magnetic insulation of electrons (twopulse mode). Measurements of the energy-density distribution of the ion beam and the ion-current density were performed. It was found that when the diode operates in the two-pulse mode, the region of the maximum ion-beam energy density in the focal plane is displaced relative to the region of the maximum ion-current density by 5–10 mm. It is shown that the effect of a displacement of the focal spot with the maximum energy density is determined by the presence of a large number of accelerated neutral atoms in the ion beam. These atoms are produced as a result of the ion charge-exchange process in the anode–cathode gap of the ion diode during its operation in the two-pulse mode.
AB - The results of investigating the focusing of a high-power ion beam, which is formed by a diode with a semicylindrical geometry and a passive anode, are presented. Two types of focusing diodes were investigated: with external magnetic insulation (one-pulse mode) and self-magnetic insulation of electrons (twopulse mode). Measurements of the energy-density distribution of the ion beam and the ion-current density were performed. It was found that when the diode operates in the two-pulse mode, the region of the maximum ion-beam energy density in the focal plane is displaced relative to the region of the maximum ion-current density by 5–10 mm. It is shown that the effect of a displacement of the focal spot with the maximum energy density is determined by the presence of a large number of accelerated neutral atoms in the ion beam. These atoms are produced as a result of the ion charge-exchange process in the anode–cathode gap of the ion diode during its operation in the two-pulse mode.
UR - http://www.scopus.com/inward/record.url?scp=85026473529&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85026473529&partnerID=8YFLogxK
U2 - 10.1134/S0020441217030277
DO - 10.1134/S0020441217030277
M3 - Article
AN - SCOPUS:85026473529
VL - 60
SP - 562
EP - 569
JO - Instruments and Experimental Techniques
JF - Instruments and Experimental Techniques
SN - 0020-4412
IS - 4
ER -