Failure modes on low voltage power MOSFETs under high temperature application

L. Dupont, S. Lefebvre, M. Bouaroudj, Z. Khatir, J. C. Faugières

Research output: Contribution to journal › Article

Abstract

HEV (hybrid electrical vehicle) is one of the harshest applications for standard technology of power devices and converters. High temperature capability and passive/active thermal cycle ageing must be evaluated. The authors present first results on ageing and failure modes for a 75 V/350 A MOSFET module from a low voltage/cycled DC current test bench. The module is without base plate and bond wires are used for electrical connections. For this kind of low voltage and high current module, paper shows that the principal modes of failure relate to the environment close to the chip (connections and passivations).

Original language	English
Pages (from-to)	1767-1772
Number of pages	6
Journal	Microelectronics Reliability
Volume	47
Issue number	9-11 SPEC. ISS.
DOIs	https://doi.org/10.1016/j.microrel.2007.07.066
Publication status	Published - 1 Aug 2007
Externally published	Yes

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ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Safety, Risk, Reliability and Quality
Surfaces, Coatings and Films
Electrical and Electronic Engineering

Cite this

Dupont, L., Lefebvre, S., Bouaroudj, M., Khatir, Z., & Faugières, J. C. (2007). Failure modes on low voltage power MOSFETs under high temperature application. Microelectronics Reliability, 47(9-11 SPEC. ISS.), 1767-1772. https://doi.org/10.1016/j.microrel.2007.07.066

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Access to Document

10.1016/j.microrel.2007.07.066