Failure modes on low voltage power MOSFETs under high temperature application

L. Dupont, S. Lefebvre, M. Bouaroudj, Z. Khatir, J. C. Faugières

Research output: Contribution to journal › Article

Abstract

HEV (hybrid electrical vehicle) is one of the harshest applications for standard technology of power devices and converters. High temperature capability and passive/active thermal cycle ageing must be evaluated. The authors present first results on ageing and failure modes for a 75 V/350 A MOSFET module from a low voltage/cycled DC current test bench. The module is without base plate and bond wires are used for electrical connections. For this kind of low voltage and high current module, paper shows that the principal modes of failure relate to the environment close to the chip (connections and passivations).

Original language	English
Pages (from-to)	1767-1772
Number of pages	6
Journal	Microelectronics Reliability
Volume	47
Issue number	9-11 SPEC. ISS.
DOIs	https://doi.org/10.1016/j.microrel.2007.07.066
Publication status	Published - 1 Aug 2007
Externally published	Yes

Fingerprint

High temperature applications

failure modes

low voltage

Failure modes

field effect transistors

modules

Aging of materials

Electric potential

Passivation

Wire

seats

passivity

converters

high current

vehicles

direct current

chips

wire

cycles

Temperature

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Safety, Risk, Reliability and Quality
Surfaces, Coatings and Films
Electrical and Electronic Engineering

Cite this

Dupont, L., Lefebvre, S., Bouaroudj, M., Khatir, Z., & Faugières, J. C. (2007). Failure modes on low voltage power MOSFETs under high temperature application. Microelectronics Reliability, 47(9-11 SPEC. ISS.), 1767-1772. https://doi.org/10.1016/j.microrel.2007.07.066

Failure modes on low voltage power MOSFETs under high temperature application. / Dupont, L.; Lefebvre, S.; Bouaroudj, M.; Khatir, Z.; Faugières, J. C.

In: Microelectronics Reliability, Vol. 47, No. 9-11 SPEC. ISS., 01.08.2007, p. 1767-1772.

Research output: Contribution to journal › Article

Dupont, L, Lefebvre, S, Bouaroudj, M, Khatir, Z & Faugières, JC 2007, 'Failure modes on low voltage power MOSFETs under high temperature application', Microelectronics Reliability, vol. 47, no. 9-11 SPEC. ISS., pp. 1767-1772. https://doi.org/10.1016/j.microrel.2007.07.066

Dupont L, Lefebvre S, Bouaroudj M, Khatir Z, Faugières JC. Failure modes on low voltage power MOSFETs under high temperature application. Microelectronics Reliability. 2007 Aug 1;47(9-11 SPEC. ISS.):1767-1772. https://doi.org/10.1016/j.microrel.2007.07.066

Dupont, L. ; Lefebvre, S. ; Bouaroudj, M. ; Khatir, Z. ; Faugières, J. C. / Failure modes on low voltage power MOSFETs under high temperature application. In: Microelectronics Reliability. 2007 ; Vol. 47, No. 9-11 SPEC. ISS. pp. 1767-1772.

@article{b8ff21f684064bf59353bab71a045ac5,

title = "Failure modes on low voltage power MOSFETs under high temperature application",

abstract = "HEV (hybrid electrical vehicle) is one of the harshest applications for standard technology of power devices and converters. High temperature capability and passive/active thermal cycle ageing must be evaluated. The authors present first results on ageing and failure modes for a 75 V/350 A MOSFET module from a low voltage/cycled DC current test bench. The module is without base plate and bond wires are used for electrical connections. For this kind of low voltage and high current module, paper shows that the principal modes of failure relate to the environment close to the chip (connections and passivations).",

author = "L. Dupont and S. Lefebvre and M. Bouaroudj and Z. Khatir and Faugi{\`e}res, {J. C.}",

year = "2007",

month = "8",

day = "1",

doi = "10.1016/j.microrel.2007.07.066",

language = "English",

volume = "47",

pages = "1767--1772",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier Limited",

number = "9-11 SPEC. ISS.",

}

TY - JOUR

T1 - Failure modes on low voltage power MOSFETs under high temperature application

AU - Dupont, L.

AU - Lefebvre, S.

AU - Bouaroudj, M.

AU - Khatir, Z.

AU - Faugières, J. C.

PY - 2007/8/1

Y1 - 2007/8/1

N2 - HEV (hybrid electrical vehicle) is one of the harshest applications for standard technology of power devices and converters. High temperature capability and passive/active thermal cycle ageing must be evaluated. The authors present first results on ageing and failure modes for a 75 V/350 A MOSFET module from a low voltage/cycled DC current test bench. The module is without base plate and bond wires are used for electrical connections. For this kind of low voltage and high current module, paper shows that the principal modes of failure relate to the environment close to the chip (connections and passivations).

AB - HEV (hybrid electrical vehicle) is one of the harshest applications for standard technology of power devices and converters. High temperature capability and passive/active thermal cycle ageing must be evaluated. The authors present first results on ageing and failure modes for a 75 V/350 A MOSFET module from a low voltage/cycled DC current test bench. The module is without base plate and bond wires are used for electrical connections. For this kind of low voltage and high current module, paper shows that the principal modes of failure relate to the environment close to the chip (connections and passivations).

UR - http://www.scopus.com/inward/record.url?scp=34548711305&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=34548711305&partnerID=8YFLogxK

U2 - 10.1016/j.microrel.2007.07.066

DO - 10.1016/j.microrel.2007.07.066

M3 - Article

VL - 47

SP - 1767

EP - 1772

JO - Microelectronics Reliability

JF - Microelectronics Reliability

SN - 0026-2714

IS - 9-11 SPEC. ISS.

ER -

Access to Document

10.1016/j.microrel.2007.07.066