Failure modes on low voltage power MOSFETs under high temperature application

L. Dupont, S. Lefebvre, M. Bouaroudj, Z. Khatir, J. C. Faugières

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

HEV (hybrid electrical vehicle) is one of the harshest applications for standard technology of power devices and converters. High temperature capability and passive/active thermal cycle ageing must be evaluated. The authors present first results on ageing and failure modes for a 75 V/350 A MOSFET module from a low voltage/cycled DC current test bench. The module is without base plate and bond wires are used for electrical connections. For this kind of low voltage and high current module, paper shows that the principal modes of failure relate to the environment close to the chip (connections and passivations).

Original languageEnglish
Pages (from-to)1767-1772
Number of pages6
JournalMicroelectronics Reliability
Volume47
Issue number9-11 SPEC. ISS.
DOIs
Publication statusPublished - 1 Aug 2007
Externally publishedYes

Fingerprint

High temperature applications
failure modes
low voltage
Failure modes
field effect transistors
modules
Aging of materials
Electric potential
Passivation
Wire
seats
passivity
converters
high current
vehicles
direct current
chips
wire
cycles
Temperature

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Safety, Risk, Reliability and Quality
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

Cite this

Failure modes on low voltage power MOSFETs under high temperature application. / Dupont, L.; Lefebvre, S.; Bouaroudj, M.; Khatir, Z.; Faugières, J. C.

In: Microelectronics Reliability, Vol. 47, No. 9-11 SPEC. ISS., 01.08.2007, p. 1767-1772.

Research output: Contribution to journalArticle

Dupont, L. ; Lefebvre, S. ; Bouaroudj, M. ; Khatir, Z. ; Faugières, J. C. / Failure modes on low voltage power MOSFETs under high temperature application. In: Microelectronics Reliability. 2007 ; Vol. 47, No. 9-11 SPEC. ISS. pp. 1767-1772.
@article{b8ff21f684064bf59353bab71a045ac5,
title = "Failure modes on low voltage power MOSFETs under high temperature application",
abstract = "HEV (hybrid electrical vehicle) is one of the harshest applications for standard technology of power devices and converters. High temperature capability and passive/active thermal cycle ageing must be evaluated. The authors present first results on ageing and failure modes for a 75 V/350 A MOSFET module from a low voltage/cycled DC current test bench. The module is without base plate and bond wires are used for electrical connections. For this kind of low voltage and high current module, paper shows that the principal modes of failure relate to the environment close to the chip (connections and passivations).",
author = "L. Dupont and S. Lefebvre and M. Bouaroudj and Z. Khatir and Faugi{\`e}res, {J. C.}",
year = "2007",
month = "8",
day = "1",
doi = "10.1016/j.microrel.2007.07.066",
language = "English",
volume = "47",
pages = "1767--1772",
journal = "Microelectronics Reliability",
issn = "0026-2714",
publisher = "Elsevier Limited",
number = "9-11 SPEC. ISS.",

}

TY - JOUR

T1 - Failure modes on low voltage power MOSFETs under high temperature application

AU - Dupont, L.

AU - Lefebvre, S.

AU - Bouaroudj, M.

AU - Khatir, Z.

AU - Faugières, J. C.

PY - 2007/8/1

Y1 - 2007/8/1

N2 - HEV (hybrid electrical vehicle) is one of the harshest applications for standard technology of power devices and converters. High temperature capability and passive/active thermal cycle ageing must be evaluated. The authors present first results on ageing and failure modes for a 75 V/350 A MOSFET module from a low voltage/cycled DC current test bench. The module is without base plate and bond wires are used for electrical connections. For this kind of low voltage and high current module, paper shows that the principal modes of failure relate to the environment close to the chip (connections and passivations).

AB - HEV (hybrid electrical vehicle) is one of the harshest applications for standard technology of power devices and converters. High temperature capability and passive/active thermal cycle ageing must be evaluated. The authors present first results on ageing and failure modes for a 75 V/350 A MOSFET module from a low voltage/cycled DC current test bench. The module is without base plate and bond wires are used for electrical connections. For this kind of low voltage and high current module, paper shows that the principal modes of failure relate to the environment close to the chip (connections and passivations).

UR - http://www.scopus.com/inward/record.url?scp=34548711305&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=34548711305&partnerID=8YFLogxK

U2 - 10.1016/j.microrel.2007.07.066

DO - 10.1016/j.microrel.2007.07.066

M3 - Article

VL - 47

SP - 1767

EP - 1772

JO - Microelectronics Reliability

JF - Microelectronics Reliability

SN - 0026-2714

IS - 9-11 SPEC. ISS.

ER -