Extremely low emittance beam size diagnostics with sub-micrometer resolution using optical transition radiation

K. Kruchinin, S. T. Boogert, P. Karataev, L. J. Nevay, B. Bolzon, T. Lefevre, S. Mazzoni, A. Aryshev, M. Shevelev, N. Terunuma, J. Urakawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

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Physics & Astronomy

Engineering & Materials Science