Express evaluation of measurement uncertainty digital power meter in LabVIEW

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

The procedures of uncertainty calculation of digital power meter are developed. The uncertainty calculation procedures are performed in LabVIEW.

Original languageEnglish
Title of host publication2016 3rd International Conference on Electrical, Electronics, Computer Engineering and their Applications, EECEA 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages52-56
Number of pages5
ISBN (Electronic)9781467369428
DOIs
Publication statusPublished - 17 May 2016
Event3rd International Conference on Electrical, Electronics, Computer Engineering and their Applications, EECEA 2016 - Beirut, Lebanon
Duration: 21 Apr 201623 Apr 2016

Conference

Conference3rd International Conference on Electrical, Electronics, Computer Engineering and their Applications, EECEA 2016
CountryLebanon
CityBeirut
Period21.4.1623.4.16

Keywords

  • active power
  • digital power meter
  • distortion power
  • LabVIEW
  • reactive power
  • standard uncertainty

ASJC Scopus subject areas

  • Hardware and Architecture
  • Computer Networks and Communications
  • Computer Science Applications
  • Electrical and Electronic Engineering

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  • Activities

    • 1 Participation in conference

    The Third International Conference on Electrical, Electronics, Computer Engineering and their Applications (EECEA2016)

    Evgeniia Alexandrovna Moldovanova, (Participant), & Olga Valerievna Galtseva (Participant)

    21 Apr 201623 Apr 2016

    Activity: Participating in or organising an event typesParticipation in conference

    Cite this

    Natalinova, N. M., Galtseva, O. V., & Moldovanova, E. A. (2016). Express evaluation of measurement uncertainty digital power meter in LabVIEW. In 2016 3rd International Conference on Electrical, Electronics, Computer Engineering and their Applications, EECEA 2016 (pp. 52-56). [7470765] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EECEA.2016.7470765