Explosive, critical electron emission from dielectric induced by high-current-density electron beam injection; Theoretical and computer simulation

D. I. Vaisburd, T. A. Tukhfatulin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

High-current-density (HCD) electron beams of nanosecond pulse duration are applied for charge injection into various dielectrics to induce the critical electron emission from dielectric into vacuum. It is shown that critical electron emission induced by HCD injection of electrons arises in the form of gigantic single pulse, which is of peak value of 10-1000 A and delayed from injection one for 1-20 ns. Delay time depends on the current density of primary electron beam. The direct experimental evidence is obtained for intense generation of free electrons and holes in subsurface layer of a dielectric owing to Poole-Frenkel effect and impact ionization of traps in high electric field. And this process is considered to be the main reason for the sharp transition of the ordinary low-current-density field electron emission to the high-power one. The last is not uniform and accompanied by point explosions on the dielectric surface and ejections of ion plasmas from these points into vacuum. And these explosions are considered as the main reason for the transition of the field electron emission from dielectric (FEED) to the critical one. So the last is explosion electron emission of dielectrics (EEED). If the electron current to the emitting centers on the dielectric surface is maintained at the necessary value then the critical electron emission always causes the vacuum discharge between the dielectric surface and metallic collector. The mechanism of EEED is discussed using the computer simulation of the basic processes.

Original languageEnglish
Title of host publicationInternational Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV
EditorsJ. Wetzer
Place of PublicationPiscataway, NJ, United States
PublisherIEEE
Pages166-169
Number of pages4
Volume1
Publication statusPublished - 1998
EventProceedings of the 1998 18th Interantional Symposium on Discharges and Electrical Insulation in Vacuum. Part 1 (of 2) - Eindhoven, Neth
Duration: 17 Aug 199821 Aug 1998

Other

OtherProceedings of the 1998 18th Interantional Symposium on Discharges and Electrical Insulation in Vacuum. Part 1 (of 2)
CityEindhoven, Neth
Period17.8.9821.8.98

Fingerprint

Electron emission
Electron beams
Current density
Computer simulation
Explosions
Vacuum
Electron transitions
Electrons
Charge injection
Impact ionization
Time delay
Electric fields
Plasmas
Ions

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Vaisburd, D. I., & Tukhfatulin, T. A. (1998). Explosive, critical electron emission from dielectric induced by high-current-density electron beam injection; Theoretical and computer simulation. In J. Wetzer (Ed.), International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV (Vol. 1, pp. 166-169). Piscataway, NJ, United States: IEEE.

Explosive, critical electron emission from dielectric induced by high-current-density electron beam injection; Theoretical and computer simulation. / Vaisburd, D. I.; Tukhfatulin, T. A.

International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV. ed. / J. Wetzer. Vol. 1 Piscataway, NJ, United States : IEEE, 1998. p. 166-169.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Vaisburd, DI & Tukhfatulin, TA 1998, Explosive, critical electron emission from dielectric induced by high-current-density electron beam injection; Theoretical and computer simulation. in J Wetzer (ed.), International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV. vol. 1, IEEE, Piscataway, NJ, United States, pp. 166-169, Proceedings of the 1998 18th Interantional Symposium on Discharges and Electrical Insulation in Vacuum. Part 1 (of 2), Eindhoven, Neth, 17.8.98.
Vaisburd DI, Tukhfatulin TA. Explosive, critical electron emission from dielectric induced by high-current-density electron beam injection; Theoretical and computer simulation. In Wetzer J, editor, International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV. Vol. 1. Piscataway, NJ, United States: IEEE. 1998. p. 166-169
Vaisburd, D. I. ; Tukhfatulin, T. A. / Explosive, critical electron emission from dielectric induced by high-current-density electron beam injection; Theoretical and computer simulation. International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV. editor / J. Wetzer. Vol. 1 Piscataway, NJ, United States : IEEE, 1998. pp. 166-169
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