Abstract
The paper reports on a study of physical processes occurring in a high-current vacuum arc shunted by semiconductor devices. Dynamics of the current redistribution between the arc discharge in a vacuum circuit breaker (VCB) and an assembly of several semiconductor devices connected in parallel to the VCB is demonstrated.
| Original language | English |
|---|---|
| Title of host publication | Proceedings - International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 501-503 |
| Number of pages | 3 |
| ISBN (Print) | 9781479967506 |
| DOIs | |
| Publication status | Published - 18 Nov 2014 |
| Event | 26th International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV 2014 - Mumbai, India Duration: 28 Sep 2014 → 3 Oct 2014 |
Other
| Other | 26th International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV 2014 |
|---|---|
| Country | India |
| City | Mumbai |
| Period | 28.9.14 → 3.10.14 |
ASJC Scopus subject areas
- Computer Networks and Communications
- Software
Fingerprint Dive into the research topics of 'Experimental study of dynamics of current redistribution at parallel connection of vacuum interrupter and diode assembly'. Together they form a unique fingerprint.
Cite this
Popov, S. A., Schneider, A. V., Batrakov, A. V., & Lavrinovich, V. A. (2014). Experimental study of dynamics of current redistribution at parallel connection of vacuum interrupter and diode assembly. In Proceedings - International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV (pp. 501-503). [6961729] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/DEIV.2014.6961729